C_TR8100LV_EN

IN CIRCUIT TEST SPECIFICATIONS Headquarters,T aipei,T aiwan 7F ., No .45, Dexing W est Rd., Shilin Dist., T aipei City 11158, T aiwan TEL: +886-2-2832-8918 F AX: +886-2-2831-0598 E-Mail: sales@tri.com.tw http://www.tri.c…

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IN CIRCUIT TEST
SPECIFICATIONS
Headquarters,Taipei,Taiwan
7F., No.45, Dexing West Rd.,
Shilin Dist., Taipei City 11158, Taiwan
TEL: +886-2-2832-8918
FAX: +886-2-2831-0598
E-Mail: sales@tri.com.tw
http://www.tri.com.tw
Linkou, Taiwan
No.256, Huaya 2nd Rd.,Guishan Dist.,
Taoyuan City 33383, Taiwan
TEL: +886-2-2832-8918
FAX: +886-3-328-6579
Hsinchu, Taiwan
7F., No.47, Guangming 6th Rd., Zhubei
City, Hsinchu County 30268, Taiwan
TEL: +886-3-553-9796
FAX: +886-3-553-9786
USA
832 Jury Court, Suite 4,
San Jose, CA 95112 U.S.A
TEL: +1-408-567-9898
FAX: +1-408-567-9288
E-mail: triusa@tri.com.tw
Malaysia
C11-1, Ground Floor, Lorong
Bayan Indah 3 Bay Avenue,
11900 Bayan Lepas Penang,
Malaysia
TEL: +604-6451171
E-mail: trimy@tri.com.tw
Europe
Gugelstr. 32
90443 Nuremberg
Germany
TEL: +49-9119-401-7827
FAX: +49-9119-400-6181
E-mail: trieurope@tri.com.tw
Japan
4-26-10 Ishiwara, Sumida-ku,
Tokyo, 130-0011 Japan
TEL: +81-3- 6273-0518
FAX: +81-3- 6273-0519
E-mail: trijp@tri.com.tw
Korea
No.207 Daewoo-Technopia,
768-1 Wonsi-Dong, Danwon-Gu,
Ansan City, Gyeonggi-Do, Korea
TEL:+82-31-470-8858
FAX:+82-31-470-8859
E-mail: trikr@tri.com.tw
Shenzhen, China
5F.3, Guangxia Rd., Shang-mei-lin
Area, Fu-Tian Dist., Shenzhen,
Guangdong, 518049, China
TEL: +86-755-83112668
FAX: +86-755-83108177
E-mail: shenzhen@cn.tri.com.tw
Suzhou, China
B Unit, Building 4, 78 Xinglin St.,
Suzhou Industrial Park, 215123,
China
TEL: +86-512-68250001
FAX: +86-512-68096639
E-mail: suzhou@cn.tri.com.tw
Shanghai, China
Room 6C, Building 14, Aly. 470,
Guiping Rd., Xuhui Dist.,
Shanghai, 200233, China
TEL: +86-21-54270101
FAX: +86-21-64957923
E-mail: shanghai@cn.tri.com.tw
TR8100LV ICT
TR8100LV
TR8100LV SERIES
GENERAL
Test Points TR8100LV Expandable to 3584, TR8100L LV Expandable to 5632
Operating System Microsoft Windows 10
Power Requirement 200-240 VAC, single phase, 50/60 Hz, 4 kVA
Fixture Type Vacuum Type Option: Pneumatic Type
ANALOG HARDWARE
Measurement Switching Matrix Analog Source
6-wire measurement
2 Programmable Voltage Source DC 0 ~ ±10V, AC 0 ~ 7Vrms
1 Programmable High Voltage Source DC 45V, 50mA Max.
1 Programmable Current Source DC 100mA Max.
Arbitrary Waveform Generator(AWG)
2 Digitally synthesized stimulus sources configurable
Frequency range 0 ~ 100KHz, Resolution: 0.15Hz, BW: 100KHz Max.
Analog Measurement
AC Voltmeter 0 ~ 100Vp
DC Voltmeter 0 ~ ±100V
TestJet Technology
Vectorless Open Circuit Detection
DIGITAL HARDWARE
Non-Multiplexing 1:1 system per pin architecture
Pin Drivers Programmable levels 0.5V to 4 V
Pin Receivers Programmable levels -5V to 5V
Sink/Source Current 500mA Max.
Pull-up / pull-down Resistor 4.7K
DUT Power Supplies 5V@5A,3.3V@5A,12V@5A,0.2 ~ 20V@3A,-3 ~ -20V@3A
On- Board Programming of Flash & Support the Binary Code Input Without Coding Environment
EEPROM Memories
MAC Address Programming Supports MAC Address Programming with MAC address being supplied from server
OPTIONS
Boundary Scan B-Scan Chain Test, B-Scan Cluster Test & B-Scan Virtual Nails Test Facilities
DUT Power Supplies
Programmable 75Vmax, 8Amax(Max Power <200W)
Fixture Converter Kits available for GenRad &Teradyne
DIMENSIONS / WEIGHT
TR8100LV 1150 mm(W) x 850 mm(D) x 830 mm(H) / 390kg(Max)
(45.28” x 33.46” x 32.68” / 858lbs.)
TR8100L LV 1550 mm(W) x 850 mm(D) x 830 mm(H) / 450kg(Max)
(61.02" x 33.46” x 32.68” / 990lbs.)
POWERFUL SOFTWARE ENVIRONMENT
Microsoft Windows operating system software. User-friendly interface
Automatic Test Program Generator
Automatic disable generator of surrounding components
Automatic test generation with Auto-learning of open/short, IC Clamping Diode and TestJet technology
Auto debugging of passive components.
Built-in system self-diagnostic function
Paperless repair station & real-time process monitoring
Time selectable quality management and statistical reports
Board view instantly displays failing device and pin
C-8100LV-EN-1911
SHOP FLOOR SYSTEM
SUPPORT
• Supports text le, database, and DLL
interfaces.
• S/N and operator ID check.
• Multi-data exchange protocol.
THE MOST COSTEFFECTIVE
TEST STRATEGY
Non-Multiplexing Pin Design, Driver/Receiver
Ratio 1:1
• Optimized Nail Placement with 1:1 Ratio
Flexibility.
• ECNs do not require moving existing wires
in your xture.
• 1:1 Driver/Receiver pins provide for the
fastest test program development
and debugging solutions available.
GENRAD AND TERADYNE
CONVERSION TOOLKITS
There is no need to acquire new TRI xtures
because we can convert your existing GenRad
or Teradyne ones.
PCBA YIELD MANAGEMENT
SYSTEM
TRI's Yield Management System (YMS) is
an omni-directional, integrated solution
for today's manufacturing environment. It
gathers and analyzes data from all TRI systems
on the shop oor and delivers it an a user-
friendly report format. TRI's YMS is a exible
system to meet the present and future needs
of high-volume manufacturers.
Network setup tool
• HIGHPERFORMANCE, HIGH THROUGHPUT
INCIRCUIT TESTER
• HIGH FAULT COVERAGE TEST SOLUTION
• EASY AND FAST TEST PROGRAM
DEVELOPMENT
• FRIENDLY USER INTERFACE DESIGN
• LOWVOLTAGE SOLUTION
Component Measurement Capability
Resistance 0.1 ohm ~ 40M ohm
Capacitance 10pF ~ 40mF
Inductance 10uH ~ 60H
Re-Flow
Oven
TR8100LV
ICT / ATE
Board Testing
TR7100 Series
TR7500 Series
Post Re-Flow
Inspection
Insertion
& Wave
Soldering
F/T
Station
Server
Test Server ICT Server
Server
YMS System configuration
TR7006 Series
Solder Paste
Inspection
Customer SFC system
Pre Re-Flow
Inspection
Post Re-Flow
Inspection
ICT/ATE
Board Testing
TR518 Series
TR5000 Series
TR8000 Series
TR7100 Series
TR7500E Series
TR7100EP Series
TR7500 Series
Screen
Print
Pick
&
Place
Re-Flow
Oven
Insertion
& Wave
Soldering
F/T
Station
YMS
server
SQL
server
SPC SPC
Repair station Repair station
SFC
Interface
SFC DB
YMS Module
Process Yield
Improvement
Process Control
Alarm Module
Tester Auto
Feedback Module
Auto Feedback
Management
Tester Data
Integration Module
Defect Image
Management
Integral Excel
Report Module
SPC Module
Placer Link Module
Web Module
Barcode Check
Module
System Tool &
User Management
YMS
Specifications are subject to change without notice. All trademarks are the property of their owners.
The following are trademarks or registered trademarks of Test Research, Inc. (TRI)
The absence of a product or service name or logo from this list does not constitute a waiver of TRI’s trademark or other intellectual
property rights concerning that name or logo. All other trademarks and trade names are the property of their owners.
FEATURES TR8100LV
THE SOLUTION FOR
TESTING LOW VOLTAGE
TECHNOLOGIES
TR8100LV provides an ultra-low output
impedance to enhance low-voltage
backdriving capability.
• SN74AUC240 is a low-voltage device
where VCC=0.8v.
• TR8100LV meets the specication of
the SN74AUC240 in low-voltage
testing requirement.
FAST AND EASY TEST
PROGRAM DEVELOPMENT
Test Program Development Flowchart.
EASYTOUSE ONBOARD
PROGRAMMING SOFTWARE
MODULES
Modularized memory algorithms provide
convenient On-Board Programming function.
Flash Programming
• Supports a macro command language
• Supports conditional programming
• Supports multi vendor programming
• Menu-based debug tool
Serial Device Programming
• Menu-based test program generation
• Supports conditional programming
• Supports multi vendor programming
Fabmaster
Wire
Analysis
Retrofit
Fixturing
ATPG Debug
CAD Power Data
Frequency Data
Digital Parts Data
Analog Library
Digital Library
EEPROM Programming
SPI Programming
ISP Programming
LIMITED TEST ACCESS SOLUTIONS
• TRI ToggleScan
TM
Test: Combines Boundary-Scan test and
vectorless test to reduce the physical test probes. Includes
Connector Test, Socket Test, Resistor Array Test, Capacitor
Array Test, & Non-Boundary-Scan Chip Test.
• Drive-Through Test: Overpowers the resistors and capacitors to
control and sense signals.
• CPU-Socket Test: Applies CSS (CPU Socket Sensor) on the top of
the CPU to test the CPU without any physical test probes.
• Boundary Scan Test : The TR8100LV implements IEEE1149.1
& 1149.6 Boundary-Scan testing beginning with TRI’s ABSTG
(Automatic Boundary Scan Test program Generator). This
auto-generates test programs and reporting for dierent kinds
of test categories, such as individual boundary-scan device tests,
boundary-scan cluster test, boundary-scan devices chain test and
virtual nails test.
• Optimal Test Analyzer (OTA): Powerful software that performs line
optimal analysis for cost eciency and to decrease testing time.
INTEGRATED ASSET SCANWORKS
BOUNDARYSCAN TECHNOLOGY*
Manufacturers will be able to globally deploy solutions from both
Asset and TRI. The optional ScanWorks card solution integrated with
TRI systems provides substantial cost savings.
(*)
Optional
Power
Control
Circuit
7474
B-Scan
IC
LCD 3V
Boundary-Scan Cluster Test
U2SDRAMU1
Boundary-Scan Virtual Nails Test
Driver Receiver
U1
U2
TDI TDO TDI TDO
TMS TMS
TCKTCK
Boundary-Scan Chain Test
BSTG
USERFRIENDLY INTERFACE
TR8100LV provides a simple-to-understand exible interface
• Color syntax program editor
• C-like test language
• Editable waveform display tool
• Integrated development environment
EASY MODEL DEVELOPMENT
Narrative library structure for fast and easy edits
• Import pin information
• Library syntax check
• Integrated GUI for all device types
Import pin information
Board view with trace display capability
Waveform display
Table-based test program editor Simple test GUI Color syntax program editor
Library
Library edit tool
Multi-Chip BSDL Test
JTAG
Output Pin
Drive A Signal
To Dut
BSCAN
Chip
Vectorless
Probe
DUT
No test probes needed to detect opens and shorts
TRI TR8100LV
TRI ToggleScan
TM
Test
Drive-Through Test