C_TR5001E_EN

IN-CIRCUIT TESTER • Modular Upgradeable MDA, ICT and FCT System • High Fault Coverage T est Solution • Limited Access Solution with BScan T esting • Friendly UI for Fast and Easy Program Development TR5001E SERIES

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IN-CIRCUIT TESTER
• Modular Upgradeable MDA, ICT and FCT
System
• High Fault Coverage Test Solution
• Limited Access Solution with BScan
Testing
• Friendly UI for Fast and Easy Program
Development
TR5001E
SERIES
The Most Cost-Effective Test Strategy
Non-Multiplexing Pin Design, Driver/Receiver to Pin Ratio 1:1 .
• Optimized nail placement with 1:1 ratio flexibility
• ECNs only require moving few existing wires compared with 2:8/2:9 driver/receiver per pin
• 1:1 driver/receiver per pin provide for the fastest test program development and debugging
The most flexible ICT+FCT solution in the market. TR5001E can integrate with external
instruments for functional tests such as: PXI, Labview, ....etc.
TR5001E
Digital Test
• Full digital in-circuit test (ICT)
• Friendly UI
• On-Board Programming
• Boundary Scan
Auto-Generation of test programs
Analog Test
R, L, C Measurement
• 6-Wire Measurement
• Auto-Guarding Feature
• AC Phase Measurement
TRI Enhanced TestJet
Detects open connections on ICs,
connectors and other SMT devices.
Transistor/Diode Measurement
Waveform Display
Flash Programming
Color Syntax
Program Editor
Board View with Trace
Display Capability
TR5001E FEATURES
TRI Enhanced TestJet
Limited Access Solution
Drive Through Test
Greatly reduces test probes for passive analog components
connected in series with JTAG and BScan capable devices
and connectors.
Boundary Scan Test
Virtual nails tests for RAM,
ROM, TTL and TREE devices,
and IEEE1149.6 Test.
TRI ToggleScan
®
Test
A powerful vectorless test technology that significantly reduces number of test probes, ToggleScan
utilizes BScan and vectorless probes to test non-Bscan devices.
Dual-Stage Press Unit
Reduces fixture costs with built-in dual-stage press unit for ICT Functional Test.
Shop Floor System Support
TR5001E can integrate with many shop floor systems to help centralize production line
management and improve production quality using gathered testing data.
DUT
BScan
Chip
BScan
Chip
BScan
Chip
BScan
Chip
Non-
BScan
Device
DUT
BScan
Chip
BScan
Chip
BScan
Chip
BScan
Chip
Non-
BScan
Device
No test probes needed to detect opens and shorts
TRI’s ToggleScan
®
Test
BSCAN
Chip
DUT
- Connector/Socket
- BScan Chip
- Non-BScan Chip
- Capacitor Array
- Resistor Array
JTAG
Vectorless
Probe
TR7500 series TR5001
Post Reflow Inspection ICT Board Testing
Test Server ICT Server
Insertion
& Wave
Soldering
F/T
Station
Reflow
Oven
Server Server
•
Inspection results and data integration
•
Real time SPC and production yield
management
•
Quality reports and closed loop tracking
•
Support defect component analysis
and improvements
•
Knowledge Management (KM)
•
Productivity and Quality Management
Yield Management System
TR518 SII Series
TR5000 Series
Data Flow
Screen Print
Pick & Place
Reow Oven
Insertion & Wave
Soldering
Data
Interface
Intelligent
Integrated S/W
with YMS
SFC/MES
Feedback Flow
TR7007 Series
TR8000 Series
TR7500 Series or
TR7700 Series
TR7500 Series or
TR7700 Series
TR7600 Series