C_TR5001E_EN - 第4页

SPECIFICA TIONS C-5001E-EN-1904 Headquarters 7F ., No.45, Dexing W est Rd., Shilin Dist., T aipei City 11158, T aiwan TEL: +886-2-2832-8918 F AX: +886-2-2831-0567 E-Mail: sales@tri.com.tw http://www .tri.com.tw Linkou, T…

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The Most Cost-Effective Test Strategy
Non-Multiplexing Pin Design, Driver/Receiver to Pin Ratio 1:1 .
• Optimized nail placement with 1:1 ratio flexibility
• ECNs only require moving few existing wires compared with 2:8/2:9 driver/receiver per pin
• 1:1 driver/receiver per pin provide for the fastest test program development and debugging
The most flexible ICT+FCT solution in the market. TR5001E can integrate with external
instruments for functional tests such as: PXI, Labview, ....etc.
TR5001E
Digital Test
• Full digital in-circuit test (ICT)
• Friendly UI
• On-Board Programming
• Boundary Scan
Auto-Generation of test programs
Analog Test
R, L, C Measurement
• 6-Wire Measurement
• Auto-Guarding Feature
• AC Phase Measurement
TRI Enhanced TestJet
Detects open connections on ICs,
connectors and other SMT devices.
Transistor/Diode Measurement
Waveform Display
Flash Programming
Color Syntax
Program Editor
Board View with Trace
Display Capability
TR5001E FEATURES
TRI Enhanced TestJet
Limited Access Solution
Drive Through Test
Greatly reduces test probes for passive analog components
connected in series with JTAG and BScan capable devices
and connectors.
Boundary Scan Test
Virtual nails tests for RAM,
ROM, TTL and TREE devices,
and IEEE1149.6 Test.
TRI ToggleScan
®
Test
A powerful vectorless test technology that significantly reduces number of test probes, ToggleScan
utilizes BScan and vectorless probes to test non-Bscan devices.
Dual-Stage Press Unit
Reduces fixture costs with built-in dual-stage press unit for ICT Functional Test.
Shop Floor System Support
TR5001E can integrate with many shop floor systems to help centralize production line
management and improve production quality using gathered testing data.
DUT
BScan
Chip
BScan
Chip
BScan
Chip
BScan
Chip
Non-
BScan
Device
DUT
BScan
Chip
BScan
Chip
BScan
Chip
BScan
Chip
Non-
BScan
Device
No test probes needed to detect opens and shorts
TRI’s ToggleScan
®
Test
BSCAN
Chip
DUT
- Connector/Socket
- BScan Chip
- Non-BScan Chip
- Capacitor Array
- Resistor Array
JTAG
Vectorless
Probe
TR7500 series TR5001
Post Reflow Inspection ICT Board Testing
Test Server ICT Server
Insertion
& Wave
Soldering
F/T
Station
Reflow
Oven
Server Server
•
Inspection results and data integration
•
Real time SPC and production yield
management
•
Quality reports and closed loop tracking
•
Support defect component analysis
and improvements
•
Knowledge Management (KM)
•
Productivity and Quality Management
Yield Management System
TR518 SII Series
TR5000 Series
Data Flow
Screen Print
Pick & Place
Reow Oven
Insertion & Wave
Soldering
Data
Interface
Intelligent
Integrated S/W
with YMS
SFC/MES
Feedback Flow
TR7007 Series
TR8000 Series
TR7500 Series or
TR7700 Series
TR7500 Series or
TR7700 Series
TR7600 Series
C-5001E-EN-1904
Headquarters
7F., No.45, Dexing West Rd.,
Shilin Dist., Taipei City
11158, Taiwan
TEL: +886-2-2832-8918
FAX: +886-2-2831-0567
E-Mail: sales@tri.com.tw
http://www.tri.com.tw
Linkou, Taiwan
No.256, Huaya 2nd Rd.,
Guishan Dist., Taoyuan
City 33383, Taiwan
TEL: +886-2-2832-8918
FAX: +886-3-328-6579
Hsinchu, Taiwan
7F., No.47, Guangming 6th
Rd., Zhubei City, Hsinchu
County 30268, Taiwan
TEL: +886-2-2832-8918
FAX: +886-3-553-9786
Shenzhen, China
5F.3, Guangxia Rd.,
Shang-mei-lin Area,
Fu-Tian Dist., Shenzhen,
Guangdong, 518049, China
TEL: +86-755-83112668
FAX: +86-755-83108177
E-mail: shenzhen@cn.tri.com.tw
Suzhou, China
B Unit, Building 4, 78 Xinglin St.,
Suzhou Industrial Park,
215123, China
TEL: +86-512-68250001
FAX: +86-512-68096639
E-mail: suzhou@cn.tri.com.tw
Shanghai, China
Room 6C, Building 14,
470 Guiping Rd., Xuhui Dist.,
Shanghai, 200233, China
TEL: +86-21-54270101
FAX: +86-21-64957923
E-mail: shanghai@cn.tri.com.tw
USA
832 Jury Court, Suite 4,
San Jose, CA 95112 U.S.A
TEL: +1-408-567-9898
FAX: +1-408-567-9288
E-mail: triusa@tri.com.tw
Europe
O’Brien Strasse 14
91126 Schwabach
Germany
TEL: +49-9122-631-2127
FAX: +49-9122-631-2147
E-mail: trieurope@tri.com.tw
Japan
2-9-9 Midori, Sumida-ku,
Tokyo, 130-0021 Japan
TEL: +81-3-6273-0518
FAX: +81-3-6273-0519
E-mail: trijp@tri.com.tw
Korea
No.207 Daewoo-Technopia,
768-1 Wonsi-Dong, Danwon-Gu,
Ansan City, Gyeonggi-Do, Korea
TEL: +82-31-470-8858
FAX: +82-31-470-8859
E-mail: trikr@tri.com.tw
Malaysia
C11-1, Ground Floor, Lorong
Bayan Indah 3 Bay Avenue,
11900 Bayan Lepas Penang,
Malaysia
TEL: +604-6461171
E-mail: trimy@tri.com.tw
General
Maximum Analog Test Points
3200 or maximum digital test points: 1600
Operation System
Microsoft
®
Windows XP, Windows 7 - 10
Power Requirement
200-240 VAC, single phase, 50/60 Hz, 2 kVA
Air Requirement
Dry air 4 - 8 kg/cm
2
, air consumption: 28 liter/cycle
Fixture Type
Press type
Testable PCB Size
Standard
(W) 420 mm x (D) 300 mm x (H) 100 mm
Option
(W) 500 mm x (D) 350 mm x (H) 130 mm
Large size PCB can be specially made
Analog Hardware
Measurement Switching Matrix 6-wire measurement
Programmable Frequency 100 Hz, 1 kHz, 10 kHz, 100 kHz, 1 MHz
Programmable DC Voltage Source 0 - ±10 V, resolution: 6.1 mV
Programmable DC Current Source 0 - 100 mA, resolution: 0.2 mA
Programmable AC Voltage Source 0 - 10 Vpp, resolution: 6.1 mV
Programmable High Voltage Current Source
43 V max, 43 mA max
Component Measurement Capability
Resistance 0.1 ohm - 40 Mohm
Capacitance 10 pF - 40 mF
Inductance 10 μH - 60 H
Analog Measurement
AC Voltmeter
0 - 100 Vp
DC Voltmeter
0 - ±100 V, resolution: 2.5 mV - 50 mV
DC Ammeter
1 μA - 100 mA resolution: 30 nA - 30 μA
Optional Hardware
Analog Test
TestJet Technology Vectorless open circuit detection
Arbitrary Waveform Generator (AWG) Frequency range 0 – 100 kHz; resolution: 0.15 Hz
Digital Test
Non-Multiplexing 1:1 Per Pin Architecture
Pin Drivers Programmable levels 0.5 V to 3.8 V
Pin Receivers Programmable levels 0 V to 5 V
Pull-up/Pull-down Resistor 4.7 kohm
DUT Power Supplies(Voltage/Max current)
5V/3A, 3.3V/3A, 12V/3A, 18V/3A, -12V/1A, 24V/3A
Programmable DUT Power Supplies
(Max Voltage/Max current)
25V/8A, 75V/2.5A
On-board Programming of Flash & EEPROM Memories
MAC Address Programming Supports MAC address programming with MAC address
being supplied from server
Boundary Scan Include B-scan Chain Test, B-scan Cluster Test, B-Scan
Virtual Nails Test and IEEE1149.6 Test facilities to meet
demands of multiple tests
ToggleScan
Test Advanced test technology combining with BScan test
function and vectorless test functions to detect the pin
open and short defect
Tree Test Facilities with BGA Test
Pattern generator for detection of pin opens for BGA/VLSI chips
Dimensions/Weight
1000 mm
900 mm
1680-1770 mm
Unit: mm (in.) Weight: 200 kg (440.92 lbs)
Powerful Software Environment
Microsoft
®
Windows operating system software User friendly interface
Automatic Test Program Generator
Automatic protection of specific points during debug
Auto-learning and test program generation for opens/shorts test, clamping diode test and TestJet test
Auto debug of passive components
Built-in self-diagnostic function
Board view instantly displays failed devices and pins
Specifications are subject to change without notice. Content may not be used as acceptance criteria.
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® ®
TRI INNOVATION
®
The absence of a product or service name or logo from this list does not constitute a waiver
of TRI’s trademark or other intellectual property rights concerning that name or logo. All other
trademarks and trade names are the property of their owners.