141-400-57-probestationaccessoriescatalog - 第138页

PN 141-400 www.formfactor.com Probe Mounts/Holders and Pro bes • 1 22 Revision 57, February, 2023 Probe Station A ccessories Eli t e 300 and S um mi t DC Pr ob es 139 -3 31 — Coa xial Prob e (Str ai gh t ) Feat ur es • S…

100%1 / 169
PN 141-400 www.formfactor.com Probe Mounts/Holders and Probes • 121
Revision 57, February, 2023 Probe Station Accessories
151-290 — PTT Needle Probe Mount, 40 mm, HTS,
Enhanced Jack Lock Holder, MS1 Series
Features
• Enh anced probe mount for PTT needle
probes (45°)
• For use on Elite 300
• Compatible with MicroChamber TopHat
• Easy probe needle replacement
without tools
• Compatible with all 45
o
PTT series
probe needles
• Compatible with MS1 programmable positioners
Kit Contents
• Probe to positioner mount
• Jack lock holder with SSMC (f) a nd pin jack (f) connectors
• 1 m (3.3 ft) coax (m) to SSMC (m)
• 46 cm (18 in) cable with pin jack (m) to (m)
• EMI grounding strap
Compatibility
• Elite 300/AP, Elite 300/M, Summit (with HTS platen upgrade)
PN 141-400 www.formfactor.com Probe Mounts/Holders and Probes • 122
Revision 57, February, 2023 Probe Station Accessories
Elite 300 and Summit DC Probes
139-331 — Coaxial Probe (Straight)
Features
• Shielded DC measurements with
coaxial probe
• Straight configuration for multiple
probing applications when using straight o r 45° n eedles for steep
access
• Easy probe needle replacement
without tools
• Compatible with all PTT series
probe needles
• Replaceable SMA cable
• Easy connection to Elite 300
coax connection panel on
platen
• The temperature of the cable
containing arm mus t not e xceed
200°C. Usually this is suitable
for 300°C wafer temperature in
an op en setup with an a rm at
least 10mm above the wafer.
Kit Contents
• Straight shielded probe
• Integrated SMA (f) connector
• Shielded coaxial cable, 76 cm (30 in) with SMA (m) to BNC plug
Compatibility
• Elite 300, Summit, SUMMIT200
139-870 — Coaxial Probe (Bent)
Features
• Shielded DC measurements with
coaxial probe
• Ben t configuration for increased
microscope objective clearance with
high magnification/low working distance objective lenses
• Easy probe needle replacement without tools
• Compatible with all bent PTT series probe needles
• Replaceable SMA cable
• Easy connection to Elite 300
coax connection panel on
platen
• The temperature of the cable
containing arm must not
exceed 200°C. Usually this is
suitable for 300°C wafer
temperature in an open setup
with an arm at least 10mm
above the wafer.
Kit Contents
• Bent 35° shielded probe
• Integrated SMA (f) c onnector
• Shielded coaxial cable, 76 cm (30 in) with SMA (m) to BNC plug
Compatibility
• Elite 300, Summit, SUMMIT200
144-390 — Triaxial Probe (Straight)
Features
• Guarded DC measurements with
triaxial probe
• Integrated triaxial cable for low-
noise measurements
• Easy connection to Elite 300
triaxial connection panel o n
platen
• Straight configuration for multiple probing applications when using
straight or 45° needles f or steep access
• Easy p robe needle replacement without tools
• Compatible with all PTT series probe needles
• The temperature of the cable containing arm must not exceed
200°C. Usually this is suitable for 300°C wafer temperature in an
open setup with an arm at least 10mm above the wafer.
Kit Contents
• Straight triax probe
• Integrated triaxial low-noise cable, 76 cm (30 in) with triax (m)
connector
Compatibility
• Elite 300, Summit, SUMMIT200
Two (2) DPP2xx positioners
and u niversal probe mounts,
one u sing the straight coax
probe with straight needle, and
the other using a be nt coax
probe with 45° bent PTT needle
Coaxial pr obe (bent) with 45°
PTT ne edle, shown attached to
universal pr obe holder and
DPP2xx positioner.
PN 141-400 www.formfactor.com Probe Mounts/Holders and Probes • 123
Revision 57, February, 2023 Probe Station Accessories
144-391 — Triaxial Probe (Bent)
Features
• Guarded DC mea sure ments with
triaxial probe
• Integrated triaxial cable for low-noise measurements
• Easy connection to Elite 300 triaxial connection panel on p laten
• Ben t configuration for increased microscope objective clearance
with high magnification/low working distance objective lenses
• Easy probe needle replacement without tools
• Compatible with all 45° PTT serie s probe needles
• The temperature of the cable containing arm must not exceed
200°C. Usually this is suitable for 300°C wafer temperature in an
open setup with an arm at least 10mm above the wafer.
Kit Contents
• Ben t 35 ° triax probe
• Integrated triaxial low-noise cable, 76 cm (30 in) with triax (m)
connector
Compatibility
• Elite 300, Summit, SUMMIT200
144-392 — Unshielded Probe Kit
Features
• Interchangeable probe arms
(unshielded)
• Easy probe needle
replacement without tools
• Pin jack for DC electrical connection
• Compatible with all PTT series probe needles
Kit Contents
• Collet adapter with pin lock
connector (f)
• Straight u nshielded probe arm
with jack lock
• 35° bent unshielded probe arm
with jack lock
• 46 cm (18 in) cable with pin jack
(m) to (m)
Compatibility
• Elite 300, Summit, SUMMIT200
PHQ — Quick Lock Probe Holder
Features
• Replacement probe ti p
holder for MMP probes
• Quick lock needle holding
mechanism (spring-loaded
Collette style)
• Constructed of nickel plated brass that can be user-formed as
needed
Specifications
• 114 mm (4.5 in) in length
• Nickel plated brass
• Quick lock mechanism
Kit Contents
• Probe tip holder
• MAE-44/18 cable 46 cm (18 in)
Compatibility
• Summit
PHW — Wrench Lock Probe Holder
Features
• Replacement probe ti p
holder for MMP probes
• Wrench lock needle holding
mechanism (set screw hold)
• Constructed of nickel plated
brass that can be user-formed as needed
Specifications
• 114 mm (4.5 in) in length
• Nickel plated brass
• Wrench lock mechanism
Kit Contents
• Probe tip holder
• MAE-44/18 cable 46 cm (18 in)
• Allen wrench
Compatibility
• Summit
Unshielded probe (straight)
and collet shown attached to
universal probe holder and
DPP2xx positioner