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Glossary Glossary-6 Auto Site Us er Man ual Paralle l Test Vecto r Applicatio n Use of int ernal registe rs to hold and release a full set of test vectors (e.g., 20 fo r a 10-input 10-output device) at o nce. In contrast…
Glossary
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LCA
An acronym for Logic Cell Array.
LCC
An acronym for Leadless Chip Carrier—a type of device package. A 4-
sided device package with pads on the underside. Typically, the LCC is
used in surface mount applications.
LED
An acronym for Light Emitting diode. AutoSite has five LEDs: four on the
front panel and one on the disk drive.
Load Data
A device operation that moves device data into AutoSite. You can load
AutoSite with data from a device, from AutoSite’s internal disk drive, or
from a serial port (for example, from the Handler port).
Logic Verification
After programming a device, you can select test vector verification, fuse
verification, or both types of verification.
Master Device
A device that contains data you wish to program into another device. For
example, you would load data from a master device and then program
that data into a blank device.
MatchBook
A new type of socketing technology that makes handling surface-mount
devices easier. MatchBook device carriers are used with AutoSite’s stand
alone kit for single device programming.
Memory Begin Address
The first address, in hex, of the first byte of data to be used in device
operations. If the data source/destination is RAM, the memory begin
address is a RAM address. If the data source/destination is disk, the
memory begin address is the offset for a disk file.
Next Device
Used during serial set programming, this value specifies the next device
in the set. For example, if you are using 8-bit devices and have specified a
word width of 16 bits, it will require two devices to store each 16-bit
word. Depending on the value entered, the data programmed into the
next device will come from either even addresses or odd addresses.
Odd/even Byte Swap
Used during device operations for 16-bit devices, this option swaps the
Most Significant Bytes (MSB) and the Least Significant Bytes (LSB) of
16-bit words. AutoSite stores RAM data and disk file data with the
convention that the LSB of a 16-bit word resides in the even byte of
memory.
Output Record Size
The number of data bytes contained in each data record during upload.
Overblow
A condition in which fuses are blown that should not have been.
Overblown Fuse
A fuse that has been over-programmed such that the surrounding area
may have been damaged or such that fuse material splatter was created.
Splatter (or rattlers) can cause intermittent shorting.
PAL
An acronym for Programmable Array Logic. PALs are devices with
programmable AND and fixed OR arrays. This is a slightly different
architecture from a PROM or an FPLA. Other examples of PAL-type
architectures from other manufacturers include PEEL and GAL.
Glossary
Glossary-6 AutoSite User Manual
Parallel Test Vector
Application
Use of internal registers to hold and release a full set of test vectors
(e.g., 20 for a 10-input 10-output device) at once. In contrast to serial
application, parallel does not require accommodations for clocking
contention, and parallel better matches in-circuit PLD operation and
board test suites.
Part Number
The number on the device. For example, if you are using an Intel 27C256,
then the part number of the device is 27C256.
Pin-driver
The electric circuit reading or applying voltage and current pulses to the
individual pin of a device, for programming or testing. See also Universal
Pin Driver.
PLCC
An acronym for Plastic Leaded Chip Carrier. A device package with
J-shaped leads extending from four sides downward, used for surface
mount applications.
PLD
An acronym for Programmable Logic Device. A particular type of
programmable integrated circuit. Architectures range from being very
simple to very complex. Most PLDs contain two levels of logic, an AND
array followed by an OR array.
PROM
An acronym for programmable read-only memory. A device with fixed
AND and programmable OR arrays. This is a slightly different
architecture from an FPLA or a PAL.
Program
The controlled application of electrical pulses to program specific fuses or
cells in a device.
Program Device
A device operation that copies device data into a socketed device. The
programming is done according to the programming algorithm selected
in the select device stage. The programming operation can also include a
verify operation.
Program Security Fuse
A programming parameter that enables/disables the programming of the
device’s security fuse.
Program Signature
Available on only a few devices, the Program Signature is a
user-definable field that allows the user to program data into the
program signature array. For example the Program Signature could
contain the revision level or modification date of the data in the
remainder of the device.
Programmable Integrated
Circuit
One of the four basic categories of ASICs, the other three being gate
arrays, standard cells, and full custom devices. PICs and ICs that are user
configurable. PLDFs and PGAs are examples of programmable integrated
circuits.
Programming Module
The interface between AutoSite and the device. The programming
module routes the signals from AutoSite’s pin driver head to the pins on
the device.
Glossary
AutoSite User Manual Glossary-7
Reboot
The process of re-initializing the programmer. After rebooting, the
programmer is in the same state as if it had just been turned on.
Registered Devices
Devices that contain registers, rather than being combinatorial only.
Registered devices are typically used for sequencers and state machine
designs. Typical examples are 16R8, 82S159, and 22V10.
Reject Option
A post-programming device check that pulses the programmed device
with voltage to see if the device has programmed per specification. The
number of times a device is pulsed varies by manufacturer and by the
reject option you select.
Remote Control Mode
AutoSite is controlled from a host running a driver program, such as a PC
running TaskLink. Device data files can be stored on AutoSite’s disk and
on the host.
Security Fuse
A location in a programmable device that, when programmed, secures
the device from readback: the data in the device is unreadable.
Security Fuse Data
The actual data to program into the device’s security fuse.
Select Device
A procedure that tells AutoSite what device you will be using. You can
select a device in one of two ways: by entering the family/pinout code, or
by selecting the manufacturer and the device part number.
Self-test
A built-in self-diagnosis command that allows you to test various circuits
and subsystems in AutoSite, verifying proper operation or isolating
possible problem areas.
Serial Set
A method of set programming in which the devices of the set are
programmed one at a time instead of all at once.
Serial Test Vector
Application
The process of applying test vectors in a serial fashion, one input at a
time.
Serial Vector Test
A device test that applies test vector input states serially, starting with pin
one and stepping through the remaining pins. This test is a diagnostic
tool designed to help debug and classify test vector failure. Specifically,
this test is designed to isolate test vectors that are sequence dependent.
Set Programming
A type of programming in which a large data file is partitioned and
programmed into multiple memory devices.
SmartPort
A feature of AutoSite that automatically detects and adjusts AutoSite to
the presence of DCE/DTE protocol.
Source
The place from which something comes. The “something” the source is
sending is almost always data. The source can be RAM, a disk file, or one
of AutoSite’s serial ports.
Structured Test Vectors
A string of test conditions applied to a PLD in a programmer/tester to
stimulate inputs and test outputs to ensure functionality. A test vector is