Autosite_Users_Manual - 第168页
Glossary AutoSite User Manual Glossa ry-7 Reboot The process of re-initia lizing the programmer. After rebooting, the programmer is in the same state as if it had j ust been turned on. Registered D evices Devices that co…
Glossary
Glossary-6 AutoSite User Manual
Parallel Test Vector
Application
Use of internal registers to hold and release a full set of test vectors
(e.g., 20 for a 10-input 10-output device) at once. In contrast to serial
application, parallel does not require accommodations for clocking
contention, and parallel better matches in-circuit PLD operation and
board test suites.
Part Number
The number on the device. For example, if you are using an Intel 27C256,
then the part number of the device is 27C256.
Pin-driver
The electric circuit reading or applying voltage and current pulses to the
individual pin of a device, for programming or testing. See also Universal
Pin Driver.
PLCC
An acronym for Plastic Leaded Chip Carrier. A device package with
J-shaped leads extending from four sides downward, used for surface
mount applications.
PLD
An acronym for Programmable Logic Device. A particular type of
programmable integrated circuit. Architectures range from being very
simple to very complex. Most PLDs contain two levels of logic, an AND
array followed by an OR array.
PROM
An acronym for programmable read-only memory. A device with fixed
AND and programmable OR arrays. This is a slightly different
architecture from an FPLA or a PAL.
Program
The controlled application of electrical pulses to program specific fuses or
cells in a device.
Program Device
A device operation that copies device data into a socketed device. The
programming is done according to the programming algorithm selected
in the select device stage. The programming operation can also include a
verify operation.
Program Security Fuse
A programming parameter that enables/disables the programming of the
device’s security fuse.
Program Signature
Available on only a few devices, the Program Signature is a
user-definable field that allows the user to program data into the
program signature array. For example the Program Signature could
contain the revision level or modification date of the data in the
remainder of the device.
Programmable Integrated
Circuit
One of the four basic categories of ASICs, the other three being gate
arrays, standard cells, and full custom devices. PICs and ICs that are user
configurable. PLDFs and PGAs are examples of programmable integrated
circuits.
Programming Module
The interface between AutoSite and the device. The programming
module routes the signals from AutoSite’s pin driver head to the pins on
the device.
Glossary
AutoSite User Manual Glossary-7
Reboot
The process of re-initializing the programmer. After rebooting, the
programmer is in the same state as if it had just been turned on.
Registered Devices
Devices that contain registers, rather than being combinatorial only.
Registered devices are typically used for sequencers and state machine
designs. Typical examples are 16R8, 82S159, and 22V10.
Reject Option
A post-programming device check that pulses the programmed device
with voltage to see if the device has programmed per specification. The
number of times a device is pulsed varies by manufacturer and by the
reject option you select.
Remote Control Mode
AutoSite is controlled from a host running a driver program, such as a PC
running TaskLink. Device data files can be stored on AutoSite’s disk and
on the host.
Security Fuse
A location in a programmable device that, when programmed, secures
the device from readback: the data in the device is unreadable.
Security Fuse Data
The actual data to program into the device’s security fuse.
Select Device
A procedure that tells AutoSite what device you will be using. You can
select a device in one of two ways: by entering the family/pinout code, or
by selecting the manufacturer and the device part number.
Self-test
A built-in self-diagnosis command that allows you to test various circuits
and subsystems in AutoSite, verifying proper operation or isolating
possible problem areas.
Serial Set
A method of set programming in which the devices of the set are
programmed one at a time instead of all at once.
Serial Test Vector
Application
The process of applying test vectors in a serial fashion, one input at a
time.
Serial Vector Test
A device test that applies test vector input states serially, starting with pin
one and stepping through the remaining pins. This test is a diagnostic
tool designed to help debug and classify test vector failure. Specifically,
this test is designed to isolate test vectors that are sequence dependent.
Set Programming
A type of programming in which a large data file is partitioned and
programmed into multiple memory devices.
SmartPort
A feature of AutoSite that automatically detects and adjusts AutoSite to
the presence of DCE/DTE protocol.
Source
The place from which something comes. The “something” the source is
sending is almost always data. The source can be RAM, a disk file, or one
of AutoSite’s serial ports.
Structured Test Vectors
A string of test conditions applied to a PLD in a programmer/tester to
stimulate inputs and test outputs to ensure functionality. A test vector is
Glossary
Glossary-8 AutoSite User Manual
one such string, e.g., 20 characters for a 20-pin PLD, with 10 input signals
and 10 expected outputs.
Structured Test Vectors
(design)
Structured vectors created by the design engineer to confirm that the
design is operating as intended, e.g., that a 10-bit counter is counting to
10. Design vectors are used in both preprogramming simulation and
manufacturing.
Structured Test Vectors
(device)
Structured vectors created by the design engineer, test engineer, or an
automatic test vector generation program, which confirm that the device
is operating properly after programming, e.g., that nothing can happen in
the device to prevent the 10-bit counter from operating correctly. An
exhaustive set of device vectors will assure that no undetectable faults
may occur.
Sumcheck
A 4- or 8-digit hexadecimal number that, when compared to the original
data, allows you to verify that a copy of the data matches the original
data. Memory devices have 8-digit sumchecks and logic devices have
4-digit sumchecks. For devices in a set, you can calculate the individual
sumcheck of the device and the sumcheck of the entire set.
Terminal Emulator
A program to enable a PC or other computer to act as an ASCII terminal.
Allows a PC to be used to communicate with a programmer in terminal
mode or with a mainframe.
Test Vector
Test vectors functionally test the device, using structured test vectors
stored in memory or in a disk file.
Test Vector Stretching
Conversion of DIP test vectors to equivalent PLCC test vectors by adding
don’t care vector characters into the string to correspond with the PLCC’s
dead pins.
Total Set Size
Used during serial set programming, this value specifies how many
devices are in a set.
Translate DIP/LCC Vectors
See JEDEC I/O translate DIP/LCC Vectors.
Translation Formats
A form of transmission protocol, these formats are used when
transferring data between the programmer and a host computer. The
different formats represent different ways of encoding the device data in
a data file. The data file could contain the fuse pattern for a logic device or
the data for a memory device.
Transmit Pacing
The number of milliseconds AutoSite will insert as a time-delay between
characters transmitted to the host computer during uploading. The time
delay is specified in tenths of milliseconds.
Underblow
A condition in which fuses that should have been blown or programmed
were not.