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SEMI E122.1-0703 © SEMI 2003 10 Variable Name Description SECS-II Type Class Comments TextResult Arbitrary st ring of text. A[80] DVVAL Valid only in Datalog reports. UnitID Unit Serial Number. A[80] DVVAL List by test-s…

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SEMI E122.1-0703 © SEMI 2003 9
Variable Name Description SECS-II Type Class Comments
SoftwareVersion The version of this software list
element. Multiple instances of this
variable exist. See
SOFTWARE-LIST report.
A[80] DVVAL
StartTestPortID Start Test Source
(i.e. hand, keyboard, host).
A[80] DVVAL
TestBoardCalStatus Test-board calibration status. BOOLEAN SV
TestBoardID ID of current test-board. A[80] SV
TestBoardPosition A relative location of a test-site on a
test-board.
Size 2 array of U4 SV X and Y position. Site 1 is
0,0.
TestBoardSiteID A mapping of a test-site to a physical
location on the tester.
L, 3
1. SiteID
2. TestBoardID
3.
TestBoardPosition
SV
TestBoardStatus Test-board availability
(1 = enabled, 0 = disabled).
U4 SV List by test-site.
TestBoardType Type of fixture (test-board, probecard,
cable, contactor, etc.).
A[80] SV
TestHeadID The ID of the test-head. U4 SV
TestHeadStatus (2 = Not Available, 1 = enabled,
0 = disabled)
U4 SV
TestID Test identifier used to identify test
results. Multiple instances of this
variable exist. See TEST-LIST report.
U4 DVVAL
TestInstance Test instance identifier. The TestID
and TestInstance combined should be
unique for one execution of the test
p
rogram. They can be the same for all
results from units tested in parallel by
the same instance of a single test
(possibly different for a serially
applied test in a multi-site test
program).
U4 DVVAL Valid only in Datalog
reports.
TestName Test Name. Multiple instances of this
variable exist. See TEST-LIST report.
A[80] DVVAL List by TestID.
TestSetup Setup conditions used for the test.
Multiple instances of this variable
exist. See TEST-LIST report.
A[80] DVVAL List by TestID.
TestStatus Test status of a specific test in the test
program:
1 = Pass
2 = Fail
3 = Both
U4 DVVAL Valid only in Datalog
reports.
TestTime Test execution time in seconds. F4 DVVAL Valid only in Datalog
reports.
TestType 1 = Parametric Test (real value
result).
2 = Functional test (vector of
pass/fail results).
4 = Text test (arbitrary text string as
result).
Multiple instances of this variable
exist. See TEST-LIST report.
U4 DVVAL List by TestID.
SEMI E122.1-0703 © SEMI 2003 10
Variable Name Description SECS-II Type Class Comments
TextResult Arbitrary string of text. A[80] DVVAL Valid only in Datalog
reports.
UnitID Unit Serial Number. A[80] DVVAL List by test-site.
Units Electrical units to be measured.
Multiple instances of this variable
exist. See TEST-LIST report.
A[80] DVVAL
List by TestID.
VirtualConfig Current Virtual Configuration listing
all test-sites used.
L, 2
1.
TestBoardSiteID
2. TestHeadId
SV List by test-site.
NOTICE: SEMI makes no warranties or representations as to the suitability of the standards set forth herein for any
particular application. The determination of the suitability of the standard is solely the responsibility of the user.
Users are cautioned to refer to manufacturer' s instructions, product labels, product data sheets, and other relevant
literature, respecting any materials or equipment mentioned herein. These standards are subject to change without
notice.
By publication of this standard, Semiconductor Equipment and Materials International (SEMI) takes no position
respecting the validity of any patent rights or copyrights asserted in connection with any items mentioned in this
standard. Users of this standard are expressly advised that determination of any such patent rights or copyrights, and
the risk of infringement of such rights are entirely their own responsibility.
SEMI E122.1-0703 © SEMI 2003 11
RELATED INFORMATION 1
NOTICE: This related information is not an official part of SEMI E122.1 and was derived from work by the
originating committee. This related information was approved for publication by full letter ballot procedures.
R1-1 Scenarios
R1-1.1 The purpose of this section is to document possible TSEM-specific operational scenarios to provide further
context to the specifications.
R1-1.2 Normal Processing Scenario
R1-1.2.1 This scenario shows typical automated processing of materials using a materials handler and TSEM
equipment. This scenario assumes no direct link between Test Equipment and Handler. Host directs all run-to-run
processing between the two equipments. Host and Station Controller represent the same entity here. Under this
intended usage, job processing with TSEM is simplified from perspective of Host as shown in Figure R1-1.
Cell Controller HandlerTester
Operator determines all
materials ready and tools
setup to start processing
READY
START
UnitsReady
START
LOADING
AWAITING
COMMAND
BinDataReady
WORKING
READY
Factory specific
bin data disposition
BIN-UNITS
LOADING
UnitsReady
Process repeat until
all units completed
AWAITING
COMMAND
Bin out/Load
READY
Figure R1-1
Normal Processing Scenario