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SEMI E142.1-0705 © SEMI 2005 6 RELATED INFORMATION 1 ADDING SUPPLIER DATA NOTICE : This related information is not an official part of SEMI E and was derived from full letter ballot procedures on April 7, 2005. R1-1 Sche…

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SEMI E142.1-0705 © SEMI 2005 5
Object.Attribute XML Name
(Element or Attribute)
Type
SubstrateMap.SubstrateSide SubstrateSide (Attribute) SubstrateSideEnum
SubstrateMap.Orientation Orientation (Attribute) OrientationEnum
SubstrateMap.OriginLocation OriginLocation (Attribute) OriginLocationEnum
SubstrateMap.AxisDirection AxisDirection (Attribute) AxisDirectionEnum
AliasId AliasId (Element) AliasIdType
AliasId.Type Type (Attribute) xs:string
AliasId.Value Value (Attribute) MaterialId
Overlay Overlay (Element) OverlayType
Overlay.MapName MapName (Attribute) xs:string
Overlay.MapVersion MapVersion (Attribute) xs:string
ReferenceDevice ReferenceDevice (Element) ReferenceDeviceType
ReferenceDevice.Coordinates Coordinates (Element) LogicalCoordinates
ReferenceDevice.Position Position (Element) PhysicalCoordinates
BinCodeMap BinCodeMap (Element) BinCodeMapType
BinCodeMap.BinType BinType (Attribute) BinTypeEnum
BinCodeMap.NullBin NullBin (Attribute) xs:string
BinCode BinCode (Element) BinCodeType
BinCode.X X (Attribute) xs:integer
BinCode.Y Y (Attribute) xs:integer
BinCode.Number Number (Attribute) xs:integer
BinCode.Value BinCode (Element content) BinCodeContentType
BinDefinition BinDefinition (Element) BinDefinitionType
BinDefinition.BinCode BinCode (Attribute) xs:string
BinDefinition.BinCount BinCount (Attribute) xs:positiveInteger
BinDefinition.BinQuality BinQuality (Attribute) xs:string
BinDefinition.BinDescription BinDescription (Attribute) xs:string
BinDefinition.Pick Pick (Attribute) xs:boolean
DeviceId Id (Element) DeviceIdType
DeviceId.X X (Attribute) xs:integer
DeviceId.Y Y (Attribute) xs:integer
DeviceId.Value Id (Element content) xs:string
Transfer T (Element) TransferType
Transfer.FX FX (Attribute) xs:integer
Transfer.FY FY (Attribute) xs:integer
Transfer.TX TX (Attribute) xs:integer
Transfer.TY TY (Attribute) xs:integer
LogicalCoordinates.X X (Attribute) xs:integer
LogicalCoordinates.Y Y (Attribute) xs:integer
PhysicalCoordinates.X X (Attribute) xs:double
PhysicalCoordinates.Y Y (Attribute) xs:double
PhysicalCoordinates.Units Units (Attribute) xs:string
ZDimensions.Order Order (Attribute) xs:integer
ZDimensions.Height Height (Attribute) xs:double
ZDimensions.Units Units (Attribute) xs:string
SEMI E142.1-0705 © SEMI 2005 6
RELATED INFORMATION 1
ADDING SUPPLIER DATA
NOTICE: This related information is not an official part of SEMI E and was derived from full letter ballot
procedures on April 7, 2005.
R1-1 Schema Extension Example
R1-1.1 The schema may be extended such that user specific data can be added. To do this: First develop a schema
that defines extensions to one or more of the complex types defined in the standard schema, as shown below.
<?xml version="1.0" ?>
<xs:schema id="MapData"
targetNamespace="urn:semi-org:xsd.E142-1.V0105.SubstrateMap_ACMEProductsInc"
xmlns:sm="urn:semi-org:xsd.E142-1.V0105.SubstrateMap"
xmlns:xs="http://www.w3.org/2001/XMLSchema"
xmlns="urn:semi-org:xsd.E142-1.V0105.SubstrateMap_ACMEProductsInc"
elementFormDefault="qualified">
<xs:import namespace="urn:semi-org:xsd.E142-1.V0105.SubstrateMap"
schemaLocation="E142-1-V0105-Schema.xsd"/>
<xs:element name="MapData" type="sm:MapDataType"/>
<xs:complexType name="SubstrateTypeExtension">
<xs:complexContent>
<xs:extension base="sm:SubstrateType">
<xs:sequence>
<xs:element ref="SupplierData" minOccurs="0"/>
</xs:sequence>
</xs:extension>
</xs:complexContent>
</xs:complexType>
<xs:element name="SupplierData" type="SupplierDataType"/>
<xs:complexType name="SupplierDataType">
<xs:sequence>
<xs:element ref="SetupFile"/>
<xs:element ref="TestSystem"/>
<xs:element ref="TestProgram"/>
<xs:element ref="Prober"/>
<xs:element ref="Operator"/>
<xs:element ref="ProbeCard"/>
<xs:element ref="TestStartTime"/>
<xs:element ref="TestEndTime"/>
</xs:sequence>
</xs:complexType>
<xs:element name="SetupFile" type="SupplierValue"/>
<xs:element name="TestSystem" type="SupplierValue"/>
<xs:element name="TestProgram" type="SupplierValue"/>
<xs:element name="Prober" type="SupplierValue"/>
<xs:element name="Operator" type="SupplierValue"/>
<xs:element name="ProbeCard" type="SupplierValue"/>
<xs:element name="TestStartTime" type="SupplierValue"/>
<xs:element name="TestEndTime" type="SupplierValue"/>
<xs:complexType name="SupplierValue">
<xs:attribute name="Value" type="xs:string"/>
</xs:complexType>
</xs:schema>
SEMI E142.1-0705 © SEMI 2005 7
R1-2 BinCodeMap Extension Example
R1-2.1 Second: Add the namespace of the extension to your instance file:
R1-2.1.1 “xmlns:xsi=http://www.w3.org/2001/XMLSchema-instance”. Now you can specify the attribute xsi:type
in the Substrate element and include the extended data alongside the standard data. Both will be validated against
their respective schemas. See the example below that validates against the schema extension in §R1-1.
<?xml version="1.0" encoding="utf-8" ?>
<MapData xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance"
xsi:schemaLocation="urn:semi-org:xsd.E142-1.V0105.SubstrateMap_AcmeProductsInc
E142-1-V0105-Schema-Extension.xsd
urn:semi-org:xsd.E142-1.V0105.SubstrateMap
E142-1-V0105-Schema.xsd"
xmlns:sme="urn:semi-org:xsd.E142-1.V0105.SubstrateMap_AcmeProductsInc"
xmlns="urn:semi-org:xsd.E142-1.V0105.SubstrateMap">
<Substrates>
<Substrate SubstrateType="Wafer" SubstrateId="Wafer1"
xsi:type="sme:SubstrateTypeExtension" >
<GoodDevices>148</GoodDevices>
<SupplierName>XDFG</SupplierName>
<Status>Version 001</Status>
<sme:SupplierData>
<sme:SetupFile Value="58501AP"/>
<sme:TestSystem Value="TA99K04"/>
<sme:TestProgram Value="VW550CMG_151"/>
<sme:Prober Value="PRBRP05"/>
<sme:Operator Value="supeq4"/>
<sme:ProbeCard Value="PRBRB04"/>
<sme:TestStartTime Value="2004052118000000"/>
<sme:TestEndTime Value="2004052157000000"/>
</sme:SupplierData>
</Substrate>
</Substrates>
</MapData>
NOTE 1: Not all XML tools support xsi extensions yet even though it is a published XML standard.
NOTICE: SEMI makes no warranties or representations as to the suitability of the standards set forth herein for any
particular application. The determination of the suitability of the standard is solely the responsibility of the user.
Users are cautioned to refer to manufacturer's instructions, product labels, product data sheets, and other relevant
literature, respecting any materials or equipment mentioned herein. These standards are subject to change without
notice.
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respecting the validity of any patent rights or copyrights asserted in connection with any items mentioned in this
standard. Users of this standard are expressly advised that determination of any such patent rights or copyrights, and
the risk of infringement of such rights are entirely their own responsibility.
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