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SEMI D29-1101 © SEM I 2001 3 11 Related Do cuments 11.1 SEMI Standards SEMI D13 — T erminology f o r FPD Color Filter Assemb lies NOTICE: SEMI makes no warran ties or representations as to the suitabilit y of the standar…

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SEMI D29-1101 © SEMI 2001 2
6.2 Measurement Devices
6.2.1 3-dimensional Profile Measurement Device —
Use a Stylus type surface roughness measurement
device, AFM or laser microscope.
6.2.2 Color Illuminator — See SEMI D19.
6.2.3 Floodlight — See SEMI D19.
6.2.4 Microscope — See SEMI D19.
6.2.5 Spectrophotometer — Use a device in
conformance with SEMI D22.
7 Test Conditions
7.1 As long as the test condition should be written in
the test result, any combination of temperature and
heating time can be acceptable in the conditions. The
test conditions used should reflect actual conditions in
the manufacturing process of flat panel displays. Table
1 contains a reference for test temperature, maintain
time and atmosphere.
Table 1 Test Conditions
Item Device Condition Test Temperature Maintain time
1 Room Air
180°C (± 2°C)
200°C (± 2°C)
230°C (± 2°C)
1 hour (± 5%)
2 Nitrogen Gas
180°C (± 2°C)
200°C (± 2°C)
230°C (± 2°C)
1 hour (± 5%)
8 Test Specimen
8.1 Use FPD color filters for specimens. In the test
report, note the existence or non-existence of
Transparent Conductive Film (ITO etc.).
9 Procedure
9.1 Adjust the temperature on the heating device and
make sure of the furnace temperature.
9.2 Measure the spectral transmittance, chromaticity.
Observe the surface of each color layer of the specimen.
(The measurement method is described in Sections 9.6
and 9.7.)
9.3 Mount the specimen in the heating device.
9.4 After the temperature returns to the specified
temperature, keep the specimen for the prescribed
length of time.
9.5 Remove the specimen from the heating device and
cool them to room temperature.
9.6 Inspect change of the outlook and the profile of the
specimen according to the following procedures.
9.6.1 Observe the existence of peculiar changes in
exterior appearance before and after each test (e.g.
wrinkles, cracks, color “mura” etc.). It is possible for
the users of this standard to use various appropriate
methods of observation.
9.6.2 Visual observation by color illuminator from
backside.
9.6.2.1 Visual observation by a floodlight from front
side.
9.6.2.2 Microscope observation with transmitted
illumination.
9.6.2.3 Microscope observation with reflected
illumination.
9.6.2.4 Surface roughness measurement using a stylus-
type surface roughness measurement device, AFM or
laser microscope.
9.7 Measure the color changes according to the
following procedures.
9.7.1 Measure the spectral transmittance and
chromaticity of each color layer after heating using the
method described in SEMI D22. (Measurements must
be taken at the same location as before heating.)
9.7.2 Before and after the test, calculate the color
difference
∆Ε
*ab
or
∆Ε
*uv,
in each color layer,
according to ISO 7724, from the chromaticity of each
color layer.
10 Reporting Results
10.1 Report the following items:
10.1.1 report date,
10.1.2 test date,
10.1.3 heating device type and conditions of use,
10.1.4 condition of specimen (with/without
Transparent Conductive Film (ITO etc.), size, etc.),
10.1.5 conditions of test (temperature, length of time),
10.1.6 existence of change in outward appearance,
10.1.7 chromaticity, spectral transmittance of each
color layer before and after thermal treatment (number
of measuring points, position),
10.1.8 color difference of each color layer before and
after thermal treatment, and
10.1.9 change in spectral transmittance at specified
wavelength (e.g. back-light peak wavelength, etc.).
SEMI D29-1101 © SEMI 20013
11 Related Documents
11.1 SEMI Standards
SEMI D13 — Terminology for FPD Color Filter
Assemblies
NOTICE: SEMI makes no warranties or
representations as to the suitability of the standards set
forth herein for any particular application. The
determination of the suitability of the standard is solely
the responsibility of the user. Users are cautioned to
refer to manufacturer’s instructions, product labels,
product data sheets, and other relevant literature
respecting any materials mentioned herein. These
standards are subject to change without notice.
The user’s attention is called to the possibility that
compliance with this standard may require use of
copyrighted material or of an invention covered by
patent rights. By publication of this standard, SEMI
takes no position respecting the validity of any patent
rights or copyrights asserted in connection with any
item mentioned in this standard. Users of this standard
are expressly advised that determination of any such
patent rights or copyrights, and the risk of infringement
of such rights, are entirely their own responsibility.
Copyright by SEMI® (Semiconductor Equipment and Materials
International), 3081 Zanker Road, San Jose, CA 95134. Reproduction o
f
the contents in whole or in part is forbidden without express written
consent of SEMI.
SEMI D30-1101 © SEMI 20011
SEMI D30-1101
TEST METHOD FOR LIGHT RESISTANCE IN FLAT PANEL DISPLAY
(FPD) COLOR FILTERS
This test method was technically approved by the Global Flat Panel Display Materials and Components
Committee and is the direct responsibility of the Japanese Flat Panel Display Materials and Components
Committee. Current edition approved by the Japanese Regional Standards Committee on August 3, 2001.
Initially available at www.semi.org September 2001; to be published November 2001.
1 Purpose
1.1 The purpose of this document is to standardize the
method for measurement of light resistance in color
filters used for flat panel displays (FPD).
2 Scope
2.1 This method is to be used by suppliers and users of
FPD color filters to measure quality in products as well
as items under development.
2.2 This method shall be used in general FPD
production to test the resistance of color filters to light.
2.3 This standard does not purport to address safety
issues, if any, associated with its use. It is the
responsibility of the user of this standard to establish
appropriate safety and health practices and determines
the applicability of regulatory limitations prior to use.
3 Referenced Standards
3.1 SEMI Standards
SEMI D19 — Test Method for Chemical Resistance of
FPD Color Filter
SEMI D22 — Test Method for the Determination of
Color, Transmittance of FPD Color Filter Assemblies
3.2 JIS Standards (available in Japanese only)
1
JIS B7751 — Light-exposure and light-and-water-
exposure apparatus (Enclosed carbon-arc type)
3.3 ISO Standards
2
ISO 4892 — Methods of exposure to laboratory light
sources
ISO 7724
3
,
4
— Paints and varnishes -- Colorimetry
1 Japanese Standards Association, 1-24, Akasaka 4 Chome, Minato-
ku, Tokyo, 107-8440 Japan. Tel: +81-3-3583-8000, E-mail:
webmaster@jsa.or.jp, http://www.jsa.or.jp
2 International Organization for Standards(ISO), 1, rue de Varembe,
Case, postale 56 CH-1211 Geneva 20, Switzerland. Tel: +41-22-749-
01-11, E-mail: central@iso.ch, http://www.iso.ch
3 Available in Japanese as JIS Z8730 — Method for Specification of
Color Differences for Opaque Material.
4 The expression method of its colour differences is equal to the
method defined in Publication of CIE No. 87 (1990) Parametric
NOTE 1: Unless otherwise indicated, all documents cited
shall be the latest published versions.
4 Terminology
4.1 atomic force microscope (AFM) — a device which
precisely measures surface shape by gauging the
reciprocal active force between atoms through use of a
probe.
4.2 fade meter — a device which tests for the existence
of external change or characteristics in materials by
long term irradiation using fixed brilliance from a
prescribed light source.
5 Summary of Method
5.1 Measure spectral transmittance, chromaticity, and
surface shape of specimen.
5.2 Place specimen in light exposure apparatus and
irradiate for specified length of time.
5.3 Remove specimen from light exposure apparatus.
5.4 Observe visually and by microscope to see if any
exterior changes have occurred in the specimen.
5.5 Measure spectral transmittance, chromaticity, and
surface shape of specimen.
6 Apparatus
6.1 Light Exposure Apparatus — Choose a test device
to use from the following devices and specify which
device was used in the report.
6.1.1 Carbon-arc Fade Meter
6.1.2 Sunshine Carbon-arc Fade Meter
6.1.3 Xenon-arc Fade Meter
Effects in Color – Difference Evaluation. Commission Internationale
de l’Eclairage, Kegelgasse 27, A-1030 Vienna, Austria. Tel: +43-1-
714-31-87-0