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SEMI S22-1103a © SEMI 2003, 2005 38 APPENDIX 1 NOTICE : The material in this appendix is an official pa rt of SEM I S22 and was approved by full letter bal lot procedures on September 3, 2003. Table A1-1 Conductor Ampaci…
SEMI S22-1103a © SEMI 2003, 2005 37
22.14.2 250N Steady Force Test — This test applies to deflection of electrical enclosure panels.
22.14.2.1 Test Equipment — Force gauge.
22.14.2.2 Procedure — The panel is to be subjected to a steady force of 250 N ± 10 N (55.55 lbs. ± 2.22 lbs.) for a
period of 5 seconds, applied to the enclosure, fitted to the equipment, by means of a suitable test tool providing
contact over a circular plane surface 30 mm in diameter.
22.14.2.3 Acceptable Results — If flexing of the enclosure panel occurs, it should not cause shorting or reduction of
a clearance distance to less than that stipulated between the enclosure and hazardous energized parts inside.
22.15 Finger Probe Test
22.15.1 Test Equipment IEC Finger Probe (see IEC 61010).
22.15.2 Procedure — The jointed test finger is applied without force in every possible position to all outer surfaces,
including the bottom. Any enclosure panels that are not secured by a means that requires a tool to open are opened
and the finger probe is applied.
22.15.3 Acceptable Results If the finger probe cannot touch any conductive part that is energized with a
hazardous voltage under normal operating conditions, then this is an acceptable result.
22.16 Wire Flexing Test — This test applies to wiring that runs from a fixed panel to a swing panel or door and is
supplied with hazardous voltage or power.
22.16.1.1 Procedure — The swing panel or door is opened to its intended fully open position and then closed. This
process is repeated 500 times. After this is done a dielectric test is performed in accordance with Section 22.6 and
the wire is inspected for any signs of physical damage.
22.16.2 Acceptable Results — The wire passes the dielectric test and shows no visible signs of physical damage.
22.17 Reporting Test Results — include the following information on the test data form:
a) name, model, and serial number of the equipment,
b) date of test(s),
c) name(s)/signature(s) of tester(s),
d) complete test methods and conditions,
e) complete test results, and
f) complete test equipment information (type of test equipment, manufacturers' names, model numbers, serial
numbers, and calibration information).
22.17.1 The general configuration and actual operating mode that was used for the test should be clearly
documented. Where components are tested separately or only parts of the overall system are operational, this should
be documented as a condition for the test results reported. This information may be on the test data form(s) or
incorporated in the test report.
SEMI S22-1103a © SEMI 2003, 2005 38
APPENDIX 1
NOTICE: The material in this appendix is an official part of SEMI S22 and was approved by full letter ballot
procedures on September 3, 2003.
Table A1-1 Conductor Ampacity - Conductor Ampacity Table for Types TBS, SA, SIS, FEP, FEPB, MI, RHH,
RHW-2, THHN, THHW, THW-2, THWN-2, USE-2, XHH, XHHW, XHHW-2, ZW-2 or equivalent Insulation -
COPPER, 0-2000 volts, 30 Deg C ambient temperature.
Standard AWG 30 – 4: 0 percent Derated 1-3 Conductors
0% Derated
1 – 3 Current Carrying Conductors
Wire Size
Cross
Section
Area
Amps per Conductor
#1
Insulation Rating
Single Wire
Bending Space
Protective
Conductor
Wire size
Protective
Conductor
Cross
Section
Area
Metric AWG Sq. mm 60ºC 75ºC 90ºC 105ºC mm Inches Metric AWG Sq. mm
30
0.050 - 0.5 0.8 1 6.4 0.25
30
0.050
28
0.079 - 0.8 1 2 6.4 0.25
28
0.079
26
0.126 - 1 2 3 6.4 0.25
26
0.126
24
0.201 2 2 3 4 6.4 0.25
24
0.201
22
0.318 3 3 5 7 13 0.5
22
0.318
0.50
0.500 5 5 9 11 13 0.5
0.50
0.500
20
0.509 5 5 9 11 13 0.5
20
0.509
0.75
0.75 6 6 12 16 13 0.5
0.75
0.75
18
0.823 7 7 14 18 13 0.5
18
0.823
1.00
1.0 8 8 15 19 19 0.75
1.00
1.0
16
1.31 10 10 18 22 20 0.75
16
1.31
1.50
1.5 11 11 20 24 19 0.75
1.50
1.5
14
2.08 15 15 25 30 20 0.75
14
2.08
2.50
2.5 17 17 27 32 25 1.0
2.50
2.5
12
3.31 20 20 30 35 26 1.0
12
3.31
4.00
4.0 24 24 34 39 25 1.0
4.00
4.0
10
5.26 30 30 40 45 26 1.0
10
5.26
6.00
6.0 32 35 44 49 38 1.5
6.00
6.0
8
8.37 40 50 55 60 39 1.5
10
5.26
10.00
10.0 45 55 62 68 51 2
6.00
6.0
6
13.30 55 65 75 85 51 2
10
5.26
16.00
16.0 60 72 82 92 76 3
10.00
10.0
4
21.15 70 85 95 105 76 3
8
8.37
#1
Ampacity may be limited by terminal temperature rating.
SEMI S22-1103a © SEMI 2003, 2005 39
Table A1-2 Conductor Ampacity - Conductor Ampacity Table for Types TBS, SA, SIS, FEP, FEPB, MI, RHH,
RHW-2, THHN, THHW, THW-2, THWN-2, USE-2, XHH, XHHW, XHHW-2, ZW-2 or equivalent Insulation -
COPPER, 0-2000 volts, 30 Deg C ambient temperature.
Standard 25.00 Metric – 600 Kcmil: 0 percent Derated 1-3 Conductors
0% Derated
1 – 3 Current Carrying Conductors
Wire Size
Cross
Section
Area
Amps per Conductor
#1
Insulation Rating
Single Wire
Bending Space
Protective
Conductor
Wire size
Protective
Conductor
Cross
Section
Area
Metric AWG Sq. mm 60ºC 75ºC 90ºC 105ºC mm Inches Metric AWG Sq. mm
25.00
25.0 80 95 105 115 76 3
10.00
10.00
3
26.67 85 100 110 120 76 3
8
8.37
2
33.62 95 115 130 145 89 3.5
6
13.30
35.00
35.0 97 117 133 149 115 4.5
16.00
16.00
1
42.41 110 130 150 170 115 4.5
6
13.30
50.00
50.0 120 144 164 180 140 5.5
16.00
16.00
1/0
53.49 125 150 170 185 140 5.5
6
13.30
2/0
67.43 145 175 195 205 152.4 6
6
13.30
70.00
70.0 148 179 199 210 165 6.5
16.00
16.00
3/0
85.01 165 200 225 240 166 6.5
6
13.30
95.0
95.0 179 214 241 260 178 7
16.00
16.00
4/0
107.2 195 230 260 285 178 7
4
21.15
120.0
120.0 208 246 280 308 216 8.5
25.00
25.00
(250)
126.7 215 255 290 320 216 8.5
4
21.15
150.0
150.0 238 282 317 347 254 10
25.00
25.00
(300)
152.0 240 285 320 350 254 10
4
21.15
(350)
177.4 260 310 350 385 305 12
3
26.67
185.0
185.0 266 317 359 395 305 12
35.00
35.00
(400)
202.7 280 335 380 420 331 13
3
26.67
240.0
240.0 309 367 416 456 331 13
35.00
35.00
(500)
253.4 320 380 430 470 356 14
3
26.67
300.0
300.0 352 416 471 516 381 15
35.00
35.00
(600)
304.0 355 420 475 520 381 15
2
33.62
#1
Ampacity may be limited by terminal temperature rating.