MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第10页

MIL-STD-883F 4 2.3 Non-Gov ernment p ublic ations . The fol lowing document s for m a part of this doc ument to t he extent s pecif ied herei n. Unless otherwi se spec ified, the iss ues of t hese document s are thos e c…

MIL-STD-883F

2. APPLICABLE DOCUMENTS

2.1 General

. The documents listed in this section are specified in sections 3, 4, and 5 of this standard. This section does

not include documents cited in other sections of this standard or recommended for additional information or as examples.

While every effort has been made to ensure the completeness of this list, document users are cautioned that they must

meet all specified requirements documents cited in sections 3, 4, and 5 of this standard, whether or not they are listed.

2.2 Government documents

2.2.1 Specifications, standards, and handbooks

. The following specifications, standards, and handbooks form a part of

this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in

the solicitation or contract.

DEPARTMENT OF DEFENSE SPECIFICATIONS

MIL-PRF-19500 - Semiconductor Devices, General Specification For.

MIL-PRF-38534 - Hybrid Microcircuits, General Specification For.

MIL-PRF-38535 - Integrated Circuits (Microcircuits) Manufacturing, General Specification For.

DEPARTMENT OF DEFENSE STANDARDS

MIL-STD-1835 - Electronic Component Case Outlines.

DEPARTMENT OF DEFENSE HANDBOOKS

MIL-HDBK-217 - Reliability Prediction of Electronic Equipment.

MIL-HDBK-505 - Definitions of Item Levels, Item Exchangeability, Models, and Related Terms.

(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/

or www.dodssp.daps.mil or

from the Standardization Documents Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

MIL-STD-883F

2.3 Non-Government publications

. The following documents form a part of this document to the extent specified herein.

Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract.

INTERNATIONAL ORGANIZATION FOR STANDARDIZATION (ISO) STANDARDS

ISO 14644-1 - Cleanrooms and Associated Controlled Environments – Part 1: Classification of Air

Cleanliness.

ISO 14644-2 - Cleanrooms and Associated Controlled Environments – Part 2: Specifications for

Testing and Monitoring to Prove Confinued Compliance with ISO 14644-1.

(Copies of these documents are available online at http://iest.org

or from the Institute of Environmental Sciences and

Technology (IEST), 940 East Northwest Highway, Mount Prospect, IL 60056-3444.)

INSTITUTE FOR INTERCONNECTING AND PACKAGING ELECTRONIC CIRCUITS

ANSI/IUPC-T-50 - Terms and Definitions.

(Copies of these documents are available online at http://ipc.org

or from the Institute for Interconnecting and Packaging

Electronic Circuits, 7380 N. Lincoln Avenue, Lincolnwood, IL 60616.)

AMERICAN NATIONAL STANDARDS INSTITUTE (ANSI)

ANSI/NCSL Z540-1 - Calibration Laboratories and Measuring and Test Equipment,

General Requirements

ANSI/J-STD-004 - Requirements for Soldering Fluxes

ANSI/J-STD-006 - Requirements for Electronic Grade Solder Alloys and Fluxed and Non-fluxed Solid

Solders for Electronic Soldering Applications

(Copies of these documents are available online at http://ansi.org

or from to the American National Standards

International, 25 West 43

Street, 4

Floor, New York, NY 10036)

ELECTRONICS INDUSTRIES ALLIANCE

IPC/EIA/JEDEC J-STD-002 Solderability Tests for Component Leads, Terminations, Lugs, Terminals and Wires.

EIA/JESD78 IC Latch-up Test.

EIA-557-A Statistical Process Control Systems.

(Copies of these documents are available online at http://www.eia.org

or from the Electronic Industries Alliance, 2500

Wilson Boulevard, Arlington, VA 22201-3834; or to IPC, 2215 Sanders Road, Northbrook, IL 60062-6135.)

AMERICAN SOCIETY FOR TESTING AND MATERIALS (ASTM)

ASTM E 263 - Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation

of Iron.

ASTM E 264 - Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation

of Nickel.

ASTM E 265 - Standard Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by

Radioactivation of Sulfur-32.

ASTM E 526 - Standard Method for Measuring Dose for Use in Linear Accelerator Pulsed Radiation

Effects Tests.

ASTM E 666 - Standard Practice for Calculating Absorbed Dose from Gamma or X-Radiation.

ASTM E 668 - Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for

Determining Absorbed Dose on Radiation-Hardess Testing of Electronic Devices.

ASTM E 720 - Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron

Spectra Employed in Radiation-Hardness Testing of Electronics.

ASTM E 721 - Standard Method for Determining Neutron Energy Spectra with Neutron-Activation Foils

for Radiation-Hardness Testing of Electronics.

MIL-STD-883F

ASTM E 722 - Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an

equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of

Electronics.

ASTM E 1249 - Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic

Devices.

ASTM E 1250 - Standard Method for Application of Ionization Chambers to Assess the Low Energy

Gamma Component of Cobalt 60 Irradiators Used in Radiation Hardness Testing of

Silicon Electronic Devices.

ASTM E 1275 - Standard Practice for Use of a Radiochromic Film Dosimetry System.

ASTM F 458 - Standard Practice for Nondestructive Pull Testing of Wire Bonds.

ASTM F 459 - Standard Test Methods for Measuring Pull Strength of Microelectronic Wire Bonds.

ASTM F 1892 - Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor

Devices.

ASTM C 177 - Standard Test Method for Steady-State Heat Flux Measurements and Thermal

Transmission Properties by Means of the Guarded Hot-Plate Apparatus.

ASTM C 518 - Standard Test Method for Steady-State Heat Flux Measurements and Thermal

Transmission Properties by Means of the Heat Flow Meter Apparatus.

ASTM D 150 - Standard Test Methods for A-C Loss Characteristics and Permittivity (Dielectric

Constant) of Solid Electrical Insulating Materials.

ASTM D 257 - Standard Test Methods for D-C Resistance or Conductance of Insulating Materials.

ASTM D 1002 - Standard Test Method for Strength Properties of Adhesives in Shear by Tension

Loading (Metal-to-Metal).

ASTM D 3386 - Coefficient of Linear Thermal Expansion of Electrical Insulating Materials, Test Method

for.

ASTM D 3850 - Rapid Thermal Degradation of Solid Electrical Insulating Materials by

Thermogravimetric Method, Test Method for.

(Copies of these documents are available online at http://www.astm.org

or from the American Society for Testing and

Materials, P O Box C700, 100 Barr Harbor Drive, West Conshohocken, PA 19428-2959)

(Non-Government standards and other publications are normally available from the organizations that prepare or

distribute the documents. These documents also may be available in or through libraries or other informational services.)

2.4 Order of precedence

. In the event of a conflict between the text of this document and the references cited herein, the

text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations

unless a specific exemption has been obtained.