MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第105页
MIL-STD-883F METHOD 1016.1 18 June 2004 7 FIGURE 1016-2. Arrheni us plot - high temper ature oper ating t est - accel erated l ife .
MIL-STD-883F
METHOD 1016.1
18 June 2004
6
FIGURE 1016-1. Cumulative failure distribution plot
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MIL-STD-883F
METHOD 1016.1
18 June 2004
7
FIGURE 1016-2. Arrhenius plot - high temperature operating test - accelerated life
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MIL-STD-883F
METHOD 1016.1
18 June 2004
8
FIGURE 1016-3. Lognormal failure rates
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TIME = MEDIAN LIFE, (T
1
)