MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第137页

MIL-STD-883F METHOD 1020.1 15 November 1991 9 FIGURE 1020-1. Latchup s ystem .

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MIL-STD-883F
METHOD 1020.1
15 November 1991
8
3.5.2.4 Other device types
. For other types of microcircuits, such as LSI/VLSI and greater complexity circuits and hybrid
microcircuits, the worst case bias conditions, exposure states, outputs to be monitored, necessary post-irradiation testing,
and failure criteria are determined through a combination of characterization testing and analysis. These requirements are
specified in the test plan or procedure for each device. Depending on the circuit type, the device is tested as described in
3.5.2.1 to 3.5.2.3.
4. REPORT
. A latchup test report shall be prepared in which the devices tested are identified by device type,
manufacturer, date code, and lot/wafer identification. The report shall list by device serial number, pass/fail status of each
device and the doses (or dose range) delivered to each device in each radiation pulse. The test plan and procedure shall
either be appended to the test report or referenced in the test report.
5. SUMMARY
. The following details shall be specified in the applicable acquisition document:
a. Device types and quantities to be tested.
b. Temperature of test (see 2.3.6).
c. Traceability (device number, wafer/lot number, etc.) requirements and requirements for data reporting and
submission.
d. The maximum allowable recovery period.
e. Radiation pulse width and radiation dose per pulse.
f. Total dose limit for each device type.
g. Requirements for group A electrical testing pre- and post-latchup testing.
h. Test instrument requirements, if other than those indicated above.
i. Requirements for characterization, recharacterization, and analysis.
j. Minimum dc power supply current required, or value of current limiting resistor, if allowed.
MIL-STD-883F
METHOD 1020.1
15 November 1991
9
FIGURE 1020-1. Latchup system
.
MIL-STD-883F
METHOD 1020.1
15 November 1991
10
FIGURE 1020-2. Linear device latchup screen test photograph (50 µs/div)
.