MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第167页

MIL-STD-883F METHOD 1031 25 August 1983 3 FIGURE 1031-1. Graphic al repres entati on of cor rosi on test .

MIL-STD-883F

METHOD 1031

25 August 1983

3.1.1.2 Long term testing

. For long term reliability assurance testing the following modifications shall be made:

Step AB Increased to 12 hours.

Step CD Increased to 1 hour.

Step DE Remains the same one-half hour.

Step EG Bias applied at pt E and then cycled 30 minutes on, 30 minutes off during FG. Total time 24

hours.

Step EF May be extended to 4 hours if power dissipation can be minimized.

Step FG Increased to 6.5 hours. Total test time 10 weeks or 70 cycles.

Terminate test cycle at 25°C when bias is applied.

Remove from test fixture.

3.2 Measurements

. Unless otherwise specified, all electrical measurement shall be completed within 12 hours after

removal from the specified test conditions. End point measurements shall consist of group A, subgroups 1 and 7 at 25°C.

NOTE: Method 1014 fine and gross leak test must be accomplished before 3.1.1 and after 3.2. Any circuit failing the leak

test will be removed from the test lot.

4. SUMMARY

. The following details shall be provided in the applicable device specification or drawing:

a. The electrical test configuration.

b. The number of devices to be tested and the acceptance criteria.

c. Requirements for data recording, when applicable.

MIL-STD-883F

METHOD 1031

25 August 1983

FIGURE 1031-1. Graphical representation of corrosion test

MIL-STD-883F

METHOD 1031

25 August 1983

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