MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第174页

MIL-STD-883F METHOD 1033 29 May 1977 2 4. SUMMARY . The fol lowing detai ls s hall be s pecif ied in t he applic able acqui sit ion document : a. Number of write/ erase c ycles , n. b. Data r etention bak e condi tions ,…

MIL-STD-883F

METHOD 1033

29 May 1977

METHOD 1033

ENDURANCE LIFE

1. PURPOSE

. Endurance life is performed in order to demonstrate the quality and reliability of nonvolatile memory

devices subjected to repeated write/erase cycles. This method may also be used in a screening sequence or as a

preconditioning treatment prior to conducting other tests. It may be desirable to make end point, and where applicable,

intermediate measurements on a serialized device basis or on the basis of a histogram distribution by total sample in order

to increase the sensitivity of the test to parameter degradation or the progression of specific failure mechanism with cycles,

time, or temperature.

1.1 Terms and definitions

1.1.1 Endurance

. The number of write/erase cycles a device can tolerate before failing to perform to specification.

1.1.2 Write/erase cycle

. The act of changing the data from original to opposite to original in all bits of a memory device.

This may be done for all bits in parallel or serial, e.g., block, byte, or bit.

1.1.3 Data retention screen

. The unbiased baking at high temperature to accelerate the loss of charge from the storage

node.

2. APPARATUS

. The apparatus required for this test shall consist of equipment capable of write/erase cycling the

devices, a controlled temperature chamber for performing a data retention bake, and suitable electrical test equipment to

make the specified interim and end point measurements.

3. PROCEDURE

. The devices shall be write/erase cycled (all bits) for specified maximum number of cycles, followed by

electrical test, the specified data retention bake and electrical test. Interim pull points shall use the same sequence of cycle,

electrical test, data retention bake, and electrical test.

3.1 Test condition

. The case temperature, cycle time, data retention bake, and electrical test temperatures and

conditions will be specified in the applicable device specification or drawing (see 4).

3.2 Failure criteria

. No device is acceptable that exhibits:

a. Inability to write or erase across the temperature range.

b. Inability to retain data.

c. Inability to read at specified timing conditions, across the temperature and supply voltage range.

d. Inability to be write/erase cycled a minimum number of times n.

MIL-STD-883F

METHOD 1033

29 May 1977

4. SUMMARY

. The following details shall be specified in the applicable acquisition document:

a. Number of write/erase cycles, n.

b. Data retention bake conditions, including duration and temperature.

c. Electrical test case temperature and timing conditions.

d. Requirements for preconditioning, if applicable, and procedure if different than in 3.

e. Cycle conditions including temperature, type (e.g., block, byte, or bit) and write/erase pulse duration and repetition

rate.

f. The sample plan including number of devices to be cycled and acceptance number.

g. End-point and interim electrical test criteria.

MIL-STD-883F

METHOD 1034.1

18 June 2004

METHOD 1034.1

DYE PENETRANT TEST

1. PURPOSE

. This method tests the capability of a Plastic Encapsulated Microcircuit (PEM) to withstand moisture

ingress and to detect flaws in packaging materials.

2. APPARATUS

. The apparatus for the Dye Penetrant test shall be as follows.

a. Protective absorbant mats (paper/plastic)

b. 2 2000 ml containers

c. 2 1000 ml beakers

d. 2 mixing magnets

e. 2 hot plates for mixing

f. Whatman 42 filters (0.005µ)

g. 500 ml funnel

h. Fisher bell jar with stopper

i. Filtration base with vacuum accessories (fisher allied filtrator #9-788 11 cm base)

j. Vacuum pump, hoses, and clamps

k. 15 ml beaker

l. 50 ml beaker

m. 2 250 ml beakers

n. Watchglass or evaporating dish

o. Petri dish

p. Drummond 0.1 ml pipettes and plunger

q. Graduated cylinder

r. Vacuum oven

s. Heating oven

t. B1 filter / polyvar (or olympus PMG3 inverted microscope)

u. 52 film - 400 ASA

v. 57 film - 3000 ASA

3. PROCEDURES

. The following procedures shall be followed in performing the Dye Penetrant test. This technique

utilizes a low viscosity, anaerobic liquid penetrant (Resinol) which is mixed with a fluorescent powder (Yellow Dye G) and a

anaerobic accelerator (17724).

NOTE: These chemicals are skin, eye and nose irritants.