MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第181页

MIL-STD-883F METHOD 2001.2 31 August 1977 1 METHOD 2001.2 CONSTANT ACCELERATION 1. PURPOSE . This test is us ed to deter mine the eff ects of c onstant ac cel eration on mi croel ectr onic devi ces . It i s an accel erat…

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MIL-STD-883F
METHOD 1034.1
18 June 2004
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MIL-STD-883F
METHOD 2001.2
31 August 1977
1
METHOD 2001.2
CONSTANT ACCELERATION
1. PURPOSE
. This test is used to determine the effects of constant acceleration on microelectronic devices. It is an
accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and
vibration tests. It may be used as a high stress test to determine the mechanical limits of the package, internal metallization
and lead system, die or substrate attachment, and other elements of the microelectronic device. By establishing proper
stress levels, it may also be employed as an in-line 100 percent screen to detect and eliminate devices with lower than
nominal mechanical strengths in any of the structural elements.
2. APPARATUS
. Constant acceleration tests shall be made on an apparatus capable of applying the specified
acceleration for the required time.
3. PROCEDURE
. The device shall be restrained by its case, or by normal mountings, and the leads or cables secured.
Unless otherwise specified, a constant acceleration of the value specified shall then be applied to the device for 1 minute in
each of the orientations X
1
, X
2
, Y
2
, Y
1
, Z
1
, and Z
2
. For devices with internal elements mounted with the major seating plane
perpendicular to the Y axis, the Y
1
orientation shall be defined as that one in which the element tends to be removed from its
mount. Unless otherwise specified, test condition E shall apply.
Test condition
Stress level (g)
A 5,000
B 10,000
C 15,000
D 20,000
E 30,000
F 50,000
G 75,000
H 100,000
J 125,000
4. SUMMARY
. The following details shall be specified in the applicable acquisition document:
a. Amount of acceleration to be applied, in gravity units (g) if other than test condition E (see 3).
b. When required, measurements to be made after test.
c. Any variations in duration or limitations to orientation (e.g., Y
1
only) (see 3).
d. Sequence of orientations, if other than as specified (see 3).
MIL-STD-883F
METHOD 2001.2
31 August 1977
2
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