MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第195页

MIL-STD-883F METHOD 2005.2 15 August 1984 1 METHOD 2005.2 VIBRATION FATIGUE 1. PURPOSE . The purpos e of thi s tes t is to deter mine the ef fect on the devic e of vibrat ion in t he frequenc y range speci fied. 2. APPAR…

MIL-STD-883F

METHOD 2004.5

29 November 1985

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MIL-STD-883F

METHOD 2005.2

15 August 1984

METHOD 2005.2

VIBRATION FATIGUE

1. PURPOSE

. The purpose of this test is to determine the effect on the device of vibration in the frequency range

specified.

2. APPARATUS

. Apparatus for this test shall include equipment capable of providing the sustained vibration within the

specified levels and the necessary optical and electrical equipment to conduct post-test measurements.

3. PROCEDURE

. The device shall be rigidly fastened on the vibration platform and the leads or cables adequately

secured. The device shall be vibrated with a constant amplitude simple harmonic motion having a peak acceleration

corresponding to the specified test condition. For test condition A, constant amplitude harmonic motion in the range of 60

±20 Hz having an amplitude of 0.06 inch double amplitude (total excursion) shall be acceptable as an alternative to the

specified peak acceleration. The vibration shall be applied for 32 ±8 hours minimum, in each of the orientations X, Y, and Z

for a total of 96 hours, minimum. When specified, devices with an internal cavity containing parts or elements subject to

possible movement or breakage during vibration shall be further examined by radiographic examination in accordance with

method 2012 or by delidding or opening and internal visual examination at 30X magnification to reveal damage or

dislocation. Where this test is performed as part of a group or subgroup of tests, the post-test measurements or inspections

need not be performed specifically at the conclusion of this test, but may be performed once at the conclusion of the group

or subgroup.

Test condition

Peak acceleration, g

A 20

B 50

C 70

3.1 Examination

. After completion of the test, an external visual examination of the marking shall be performed without

magnification or with a viewer having a magnification no greater than 3X and a visual examination of the case, leads, or

seals shall be performed at a magnification between 10X and 20X. This examination and any additional specified

measurements and examination shall be made after completion of the final cycle or upon completion of a group, sequence,

or subgroup of tests which include this test.

3.2 Failure criteria

. After subjection to the test, failure of any specified measurement or examination (see 3 and 4),

evidence of defects or damage to the case, leads, or seals, or illegible markings shall be considered a failure. Damage to

marking caused by fixturing or handling during tests shall not be cause for device rejection.

3.3 Test frequency and amplitude

. For test condition A, B, or C, the double amplitude and frequency used shall result in

the application of the peak accelerations of 20, 50, or 70 g's. Peak acceleration may be computed using the following

equation:

g = A (F)

(2) (386)

Where: A = double amplitude in inches.

F = frequency in radians/second.

4. SUMMARY

. The following details shall be specified in the applicable acquisition document:

a. Test condition (see 3).

b. Test frequency and test double amplitude (see 3 and 3.3), if other than specified.

c. Test time and specimen orientation, if other than specified (see 3).

d. Measurements after test (see 3 and 3.1).

MIL-STD-883F

METHOD 2005.2

15 August 1984

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