MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第196页

MIL-STD-883F METHOD 2005.2 15 August 1984 2 This page i ntenti onally lef t blank

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MIL-STD-883F
METHOD 2005.2
15 August 1984
1
METHOD 2005.2
VIBRATION FATIGUE
1. PURPOSE
. The purpose of this test is to determine the effect on the device of vibration in the frequency range
specified.
2. APPARATUS
. Apparatus for this test shall include equipment capable of providing the sustained vibration within the
specified levels and the necessary optical and electrical equipment to conduct post-test measurements.
3. PROCEDURE
. The device shall be rigidly fastened on the vibration platform and the leads or cables adequately
secured. The device shall be vibrated with a constant amplitude simple harmonic motion having a peak acceleration
corresponding to the specified test condition. For test condition A, constant amplitude harmonic motion in the range of 60
±20 Hz having an amplitude of 0.06 inch double amplitude (total excursion) shall be acceptable as an alternative to the
specified peak acceleration. The vibration shall be applied for 32 ±8 hours minimum, in each of the orientations X, Y, and Z
for a total of 96 hours, minimum. When specified, devices with an internal cavity containing parts or elements subject to
possible movement or breakage during vibration shall be further examined by radiographic examination in accordance with
method 2012 or by delidding or opening and internal visual examination at 30X magnification to reveal damage or
dislocation. Where this test is performed as part of a group or subgroup of tests, the post-test measurements or inspections
need not be performed specifically at the conclusion of this test, but may be performed once at the conclusion of the group
or subgroup.
Test condition
Peak acceleration, g
A 20
B 50
C 70
3.1 Examination
. After completion of the test, an external visual examination of the marking shall be performed without
magnification or with a viewer having a magnification no greater than 3X and a visual examination of the case, leads, or
seals shall be performed at a magnification between 10X and 20X. This examination and any additional specified
measurements and examination shall be made after completion of the final cycle or upon completion of a group, sequence,
or subgroup of tests which include this test.
3.2 Failure criteria
. After subjection to the test, failure of any specified measurement or examination (see 3 and 4),
evidence of defects or damage to the case, leads, or seals, or illegible markings shall be considered a failure. Damage to
marking caused by fixturing or handling during tests shall not be cause for device rejection.
3.3 Test frequency and amplitude
. For test condition A, B, or C, the double amplitude and frequency used shall result in
the application of the peak accelerations of 20, 50, or 70 g's. Peak acceleration may be computed using the following
equation:
g = A (F)
2
(2) (386)
Where: A = double amplitude in inches.
F = frequency in radians/second.
4. SUMMARY
. The following details shall be specified in the applicable acquisition document:
a. Test condition (see 3).
b. Test frequency and test double amplitude (see 3 and 3.3), if other than specified.
c. Test time and specimen orientation, if other than specified (see 3).
d. Measurements after test (see 3 and 3.1).
MIL-STD-883F
METHOD 2005.2
15 August 1984
2
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MIL-STD-883F
METHOD 2006.1
31 August 1977
1
METHOD 2006.1
VIBRATION NOISE
1. PURPOSE
. The purpose of this test is to measure the amount of electrical noise produced by the device under
vibration.
2. APPARATUS
. Apparatus for this test shall include equipment capable of providing the required variable frequency
vibration at the specified levels, a calibrated high impedance voltmeter for noise measurement during test and the necessary
optical and electronic equipment for post-test measurements.
3. PROCEDURE
. The device and its leads shall be rigidly fastened on the vibration platform and the leads or cables
adequately secured. The device shall be vibrated with simple harmonic motion having either an amplitude of 0.06 inch
double amplitude (maximum total excursion) or a constant peak acceleration of 20 g minimum. The vibration frequency shall
be varied approximately logarithmically between 20 and 2,000 Hz. The entire frequency range shall be traversed in not less
than 4 minutes for each cycle. This cycle shall be performed once in each of the orientations X, Y, and Z (total of 3 times),
so that the motion shall be applied for a total period of approximately 12 minutes. The specified voltages and currents shall
be applied in the test circuit. The maximum noise-output voltage across the specified load resistance during traverse, shall
be measured with an average-responding root-mean-square (rms) calibrated high impedance voltmeter. The meter shall
measure, with an error of not more than 3 percent, the rms value of a sine-wave voltage at 2,000 Hz. The characteristic of
the meter over a bandwidth of 20 to 2,000 Hz shall be ±1 decibel (dB) of the value at 2,000 Hz, with an attenuation rate
below 20 and above 20,000 Hz of 6 ±2 dB per octave. The maximum inherent noise in the circuit shall be at least 10 dB
below the specified noise-output voltage. When specified, devices with an internal cavity containing parts or elements
subject to possible movement or breakage during vibration shall be further examined by radiographic examination in
accordance with method 2012 or by delidding or opening and internal visual examination at 30X magnification to reveal
damage or dislocation. Where this test is performed as part of a group or subgroup of tests, the post-test measurements or
inspections need not be performed specifically at the conclusion of this test, but may be performed once at the conclusion of
the group or subgroup.
3.1 Examination
. After completion of the test, an external visual examination of the marking shall be performed without
magnification or with a viewer having a magnification no greater than 3X and a visual examination of the case, leads, or
seals shall be performed at a magnification between 10X and 20X. This examination and any additional specified
measurements and examination shall be made after completion of the final cycle or upon completion of a group, sequence,
or subgroup of tests which include this test.
3.2 Failure criteria
. After subjection to the test, failure of any specified measurement or examination (see 3 and 4),
evidence of defects or damage to the case, leads, or seals, or illegible markings shall be considered a failure. Damage to
marking caused by fixturing or handling during tests shall not be cause for device rejection.
4. SUMMARY
. The following details shall be specified in the applicable acquisition document:
a. Test condition (see 3).
b. Test voltages and currents (see 3). Unless otherwise specified, these shall be the nominal operating voltages and
currents for the device.
c. Load resistance (see 3). Unless otherwise specified, this shall be the maximum rated operating load of the
device.
d. Measurements after test (see 3 and 3.1).
e. Noise-output voltage limit (see 3).