MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第26页
MIL-STD-883F METHOD 1001 1 May 1968 2 4. SUMMARY . The fol lowing detai ls mus t be spec ifi ed in the appl icabl e acquis iti on document: a. Method of mounting (s ee 3). b. Test condit ion lett er (s ee 3). Unl ess oth…
MIL-STD-883F
METHOD 1001
1 May 1968
1
METHOD 1001
BAROMETRIC PRESSURE, REDUCED (ALTITUDE OPERATION)
1. PURPOSE
. The barometric-pressure test is performed under conditions simulating the low atmospheric pressure
encountered in the nonpressurized portions of aircraft and other vehicles in high-altitude flight. This test is intended primarily
to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric
strength of air and other insulating materials at reduced pressures. Even when low pressures do not produce complete
electrical breakdown, corona and its undesirable effects, including losses and ionization are intensified. The simulated
high-altitude conditions of this test can also be employed to investigate the influence on components' operating
characteristics, of other effects of reduced pressure, including changes in dielectric constants of materials, and decreased
ability of thinner air to transfer heat away from heat-producing components.
2. APPARATUS
. The apparatus used for the barometric-pressure test shall consist of a vacuum pump and a suitable
sealed chamber having means for visual observation of the specimen under test when necessary, a suitable pressure
indicator to measure the simulated altitude in feet in the sealed chamber, and a microammeter or oscilloscope capable of
detecting current over the range from dc to 30 megahertz.
3. PROCEDURE
. The specimens shall be mounted in the test chamber as specified and the pressure reduced to the
value indicated in one of the following test conditions, as specified. While the specimens are maintained at the specified
pressure, the specimens shall be subjected to the specified tests. During this test and for a period of 20 minutes before, the
test temperature shall be 25°C ±10°C. The device shall have the specified voltage applied and shall be monitored over the
range from atmospheric pressure to the specified minimum pressure and return for any device malfunctions. A device which
exhibits arc-overs, harmful coronas, or any other defect or deterioration which may interfere with the operation of the device
shall be considered a failure.
Test condition Pressure, maximum Altitude
Inches of mercury mm of mercury Feet Meters
A 17.3 439.00 15,000
4,572
B 8.88 226.00 30,000
9,144
C 3.44 87.00 50,000
15,240
D 1.31 33.00 70,000
21,336
E 0.315 8.00 100,000
30,480
F 0.043 1.09 150,000
45,720
G 9.436 x 10
-8
2.40 x 10
-6
656,000
200,000
3.1 Measurement
. The device shall be connected for measurement and have the specified voltages applied during the
entire pump-down cycle. The terminals to which the maximum voltage (see 4c.) is applied shall be monitored with a
microammeter or oscilloscope for corona currents in the range from dc to 30 megahertz. Provision shall be made for
calibrating the current flow in the test circuit minus the device under the applicable test condition to insure that test readings
are characteristic of the device under test.
MIL-STD-883F
METHOD 1001
1 May 1968
2
4. SUMMARY
. The following details must be specified in the applicable acquisition document:
a. Method of mounting (see 3).
b. Test condition letter (see 3). Unless otherwise specified, condition E shall be used.
c. Tests during subjection to reduced pressure (see 3). Unless otherwise specified, the device shall be subjected to
the maximum voltage it would be subjected to under rated operating conditions.
d. Tests after subjection to reduced pressure, if applicable (see 3). Unless otherwise specified, the device shall be
subjected to full electrical tests of specified device characteristics or parameters.
e. Exposure time prior to measurement, if applicable (see 3)
MIL-STD-883F
METHOD 1002
1 May 1968
1
METHOD 1002
IMMERSION
1. PURPOSE
. This test is performed to determine the effectiveness of the seal of microelectronic devices. The
immersion of the part under evaluation into liquid at widely different temperatures subjects it to thermal and mechanical
stresses which will readily detect a defective terminal assembly, or a partially closed seam or molded enclosure. Defects of
these types can result from faulty construction or from mechanical damage such as might be produced during physical or
environmental tests. The immersion test is generally performed immediately following such tests because it will tend to
aggravate any incipient defects in seals, seams, and bushings which might otherwise escape notice. This test is essentially
a laboratory test condition, and the procedure is intended only as a measurement of the effectiveness of the seal following
this test. The choice of fresh or salt water as a test liquid is dependent on the nature of the component part under test.
When electrical measurements are made after immersion cycling to obtain evidence of leakage through seals, the use of a
salt solution instead of fresh water will facilitate detection of moisture penetration. This test provides a simple and ready
means of detection of the migration of liquids. Effects noted can include lowered insulation resistance, corrosion of internal
parts, and appearance of salt crystals. The test described is not intended as a thermal- shock or corrosion test, although it
may incidentally reveal inadequacies in these respects. This is a destructive test and shall not be used as a 100 percent
test or screen.
2. APPARATUS
. The apparatus used for the immersion test shall consist of controlled temperature baths capable of
maintaining the temperatures indicated for the hot bath and the cold bath test condition selected. A suitable temperature
indicator shall be used to measure bath temperature.
3. PROCEDURE
. This test consists of successive cycles of immersions, each cycle consisting of immersion in a hot
bath of fresh (tap) water at a temperature of 65°C +5°C, -0°C followed by immersion in a cold bath. The number of cycles,
duration of each immersion, and the nature and temperature of the cold bath shall be as indicated in the applicable test
condition listed below, as specified. The transfer of specimens from one bath to another shall be accomplished as rapidly as
practicable and in no case shall transfer time exceed 15 seconds. After completion of the final cycle, specimens shall be
thoroughly and quickly washed in fresh (tap) water or distilled water and all surfaces wiped or air-blasted clean and dry.
Unless otherwise specified, measurements shall be made at least 4 hours, but not more than 48 hours, after completion of
the final cycle. When specified in the applicable acquisition document, upon completion of the electrical measurements and
external visual examination, the device shall be delidded or dissected and examined in accordance with method 2013 for
evidence of corrosion of internal elements or the appearance of salt crystals. Where this test is performed as part of a
group or subgroup of tests, the post-test measurements or inspections need not be performed specifically at the conclusion
of this test, but may be performed once at the conclusion of the group or subgroup.