MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第280页
MIL-STD-883F METHOD 2012.7 1 June 1993 14 FIGURE 2012-7. Accept able and unacc eptable exces s mater ial .
MIL-STD-883F
METHOD 2012.7
1 June 1993
13
FIGURE 2012-6. Clearance in round or box transistor type device
.
MIL-STD-883F
METHOD 2012.7
1 June 1993
14
FIGURE 2012-7. Acceptable and unacceptable excess material
.
MIL-STD-883F
METHOD 2012.7
1 June 1993
15
* FIGURE 2012-8. Clearance in cylindrical axail lead type device
.