MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第281页

MIL-STD-883F METHOD 2012.7 1 June 1993 15 * FIGURE 2012- 8. Clear ance in c ylindr ical axail lead type devic e .

100%1 / 708
MIL-STD-883F
METHOD 2012.7
1 June 1993
14
FIGURE 2012-7. Acceptable and unacceptable excess material
.
MIL-STD-883F
METHOD 2012.7
1 June 1993
15
* FIGURE 2012-8. Clearance in cylindrical axail lead type device
.
MIL-STD-883F
METHOD 2012.7
1 June 1993
16
4. Summary. The following details shall be specified in the applicable acquisition document:
a. Number of views, if other than indicated in 3.1.1.
b. Radiograph submission, if applicable (see 3.9.2).
c. Marking, if other than indicated in 3.3 and marking of samples to indicate they have been radiographed, if required
(see 3.3.3).
d. Defects to be sought in the samples and criteria for acceptance or rejection, if other than indicated in 3.10.
e. Radiograph and report retention, if applicable (see 3.9.3).
f. Test reports when required for class level B.