MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第325页

MIL-STD-883F METHOD 2018.4 18 June 2004 13 FIGURE 2018-3. Viewing angle .

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MIL-STD-883F
METHOD 2018.4
18 June 2004
12
NOTES:
1. 1, 2, 3, and 4 are directional edges.
2. 1 is a major current carrying edge.
FIGURE 2018-2. Directional edge
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MIL-STD-883F
METHOD 2018.4
18 June 2004
13
FIGURE 2018-3. Viewing angle
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MIL-STD-883F
METHOD 2018.4
18 June 2004
14
STATIONARY (EVAPORATION) WAFER-HOLDER SYSTEM
FIGURE 2018-4. Wafer sampling procedures (see table I)
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