MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第335页

MIL-STD-883F METHOD 2018.4 18 June 2004 23 FI GURE 2018-12. ( 6,000X) . Crack-like defe ct at passiv ation ste p (accep t).

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MIL-STD-883F
METHOD 2018.4
18 June 2004
22
FIGURE 2018-11. 7,000X
.
Separation of metallization at
passivation step (base contact) (reject).
MIL-STD-883F
METHOD 2018.4
18 June 2004
23
FIGURE 2018-12. (6,000X)
.
Crack-like defect at passivation step (accept).
MIL-STD-883F
METHOD 2018.4
18 June 2004
24
FIGURE 2018-13. 6,000X
.
Crack-like defect at passivation step (reject).