MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第340页

MIL-STD-883F METHOD 2018.4 18 June 2004 28 FIGURE 2018-17. 9,500X . St eep passi vation s tep (MOS) (rejec t).

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MIL-STD-883F
METHOD 2018.4
18 June 2004
27
FIGURE 2018-16. (6,000X)
.
Steep passivation step (MOS) (accept).
MIL-STD-883F
METHOD 2018.4
18 June 2004
28
FIGURE 2018-17. 9,500X
.
Steep passivation step (MOS) (reject).
MIL-STD-883F
METHOD 2018.4
18 June 2004
29
FIGURE 2018-18. (5,000X)
.
Peeling or lifting general metallization
in contact window area (reject).