MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第342页
MIL-STD-883F METHOD 2018.4 18 June 2004 30 FIGURE 2018-19. 10,000X . Gener al metal lizati on voids ( accept ).
MIL-STD-883F
METHOD 2018.4
18 June 2004
29
FIGURE 2018-18. (5,000X)
.
Peeling or lifting general metallization
in contact window area (reject).
MIL-STD-883F
METHOD 2018.4
18 June 2004
30
FIGURE 2018-19. 10,000X
.
General metallization voids (accept).
MIL-STD-883F
METHOD 2018.4
18 June 2004
31
FIGURE 2018-20. (5,000X)
.
General metallization voids (reject).