MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第343页

MIL-STD-883F METHOD 2018.4 18 June 2004 31 FI GURE 2018-20. ( 5,000X) . General met allizat ion voids (rejec t).

100%1 / 708
MIL-STD-883F
METHOD 2018.4
18 June 2004
30
FIGURE 2018-19. 10,000X
.
General metallization voids (accept).
MIL-STD-883F
METHOD 2018.4
18 June 2004
31
FIGURE 2018-20. (5,000X)
.
General metallization voids (reject).
MIL-STD-883F
METHOD 2018.4
18 June 2004
32
FIGURE 2018-21. 5,000X
.
Etch-back/undercut type of notch at
passivation step (multi-layered metal) (accept).