MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第356页
MIL-STD-883F METHOD 2019.7 07 March 2003 6 This page i ntenti onally lef t blank
MIL-STD-883F
METHOD 2019.7
07 March 2003
5
Examples of determining die strength requirements based on die area.
Example 1:
Die Area of device measuring .02 inches by .02 inches.
Die Size = .02 X .02 = .0004 IN
2
= 4 X 10
-4
(IN
2
).
Because die size is less than 5 X 10
-4
(IN
2
) use Note 3 which states the value of minimum force required is 0.04
kg/10
-4
(IN
2
) at (1X), 0.05 kg/10
-4
(IN
2
) at (1.25X), or 0.08 kg/10
-4
(IN
2
) at (2X). Thus the associated
minimum forces required are 0.16 kg, 0.20 kg and 0.32 kg, respectively.
Example 2:
Die Area of device measuring .04 inches by 0.04 inches.
Die Size = .04 X .04 = .0016 IN
2
= 16 X 10
-4
(IN
2
).
Because die size is between 5 X 10
-4
(IN
2
) and 64 X 10
-4
(IN
2
) use Note 2 which states the value of minimum
force required is to be determined based on the chart. The values for die size 16 X 10
-4
(IN
2
) are found
on the chart by reading 16 on the (10
-4
IN
2
) scale, then finding the coordinating force value on the (F)
scale. Doing so provides minimum forces required as .64 kg at (1X), .80 kg at (1.25X), and 1.28 kg at
(2X).
Example 3:
Die Area of device measuring .09 inches by .09 inches.
Die Size = .09 X .09 = .0081 IN
2
= 81 X 10
-4
(IN
2
).
Because die size is larger than 64 X 10
-4
(IN
2
) use Note 1 which states the value of minimum force required is 2.5
kg or a multiple thereof. Therefore, the minimum forces required are 2.5 kg at (1X), 3.125 kg at (1.25X),
and 5.0 kg at (2X).
MIL-STD-883F
METHOD 2019.7
07 March 2003
6
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MIL-STD-883F
METHOD 2020.8
18 June 2004
1
METHOD 2020.8
PARTICLE IMPACT NOISE DETECTION TEST
1. PURPOSE
. The purpose of this test is to detect loose particles inside a device cavity. The test provides a
nondestructive means of identifying those devices containing particles of sufficient mass that, upon impact with the case,
excite the transducer.
2. APPARATUS
. The equipment required for the particle impact noise detection (PIND) test shall consist of the following
(or equivalent):
a. A threshold detector to detect particle noise voltage exceeding a preset threshold of the absolute value of 20 ±1
millivolt peak reference to system ground.
b. A vibration shaker and driver assembly capable of providing essentially sinusoidal motion to the device under test
(DUT) at:
(1) Condition A: 20 g peak at 40 to 250 Hz.
(2) Condition B: 10 g peak at 60 Hz minimum.
c. PIND transducer, calibrated to a peak sensitivity of -77.5 ±3 dB in regards to one volt per microbar at a point within
the frequency of 150 to 160 kHz.
d. A sensitivity test unit (STU) (see figure 2020-1) for periodic assessment of the PIND system performance. The
STU shall consist of a transducer with the same tolerances as the PIND transducer and a circuit to excite the
transducer with a 250 microvolt ±20 percent pulse. The STU shall produce a pulse of about 20 mV peak on the
oscilloscope when the transducer is coupled to the PIND transducer with attachment medium.
e. PIND electronics, consisting of an amplifier with a gain of 60 ±2 dB centered at the frequency of peak sensitivity of
the PIND transducer. The noise at the output of the amplifier shall not exceed 10 mV peak.
f. Attachment medium. The attachment medium used to attach the DUT to the PIND transducer shall be the same
attachment medium as used for the STU test.
g. Shock mechanism or tool capable of imparting shock pulses of 1,000 ±200 g peak to the DUT. The duration of the
main shock shall not exceed 100 µs. If an integral co-test shock system is used the shaker vibration may be
interrupted or perturbed for period of time not to exceed 250 ms from initiation of the last shock pulse in the
sequence. The co-test duration shall be measured at the 50 ±5 percent point.
3. PROCEDURES
.
3.1 Test equipment setup
. Shaker drive frequency and amplitude shall be adjusted to the specified conditions based on
cavity size of the DUT (for condition A, see table 1 herein). The shock pulse shall be adjusted to provide 1,000 ±200 g peak
to the DUT.
3.2 Test equipment checkout
. The test equipment checkout shall be performed a minimum of one time per operation
shift. Failure of the system to meet checkout requirements shall require retest of all devices tested subsequent to the last
successful system checkout.
3.2.1 Shaker drive system checkout
. The drive system shall achieve the shaker frequency and the shaker amplitude
specified. The drive system shall be calibrated so that the frequency settings are within ±8 percent and the amplitude
vibration setting are within ±10 percent of the nominal values. If a visual displacement monitor is affixed to the transducer, it
may be used for amplitudes between 0.04 and 0.12 inch (1.02 and 3.05 mm). An accelerometer may be used over the
entire range of amplitudes and shall be used below amplitudes of 0.040 inch (1.02 mm).
*