MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第367页
MIL-STD-883F METHOD 2021.3 29 November 1985 5 FIGURE 2021-6. Etched devi ce exhibiti ng failur e cat egories , B - Cracks in gl ass over a luminu m, C - Cracks in glass or im pr oper glass , coverage al ong edge of alumi…
MIL-STD-883F
METHOD 2021.3
29 November 1985
4
FIGURE 2021-5. Etched device exhibiting failure category A
missing glass over aluminum
.
MIL-STD-883F
METHOD 2021.3
29 November 1985
5
FIGURE 2021-6. Etched device exhibiting failure categories,
B - Cracks in glass over aluminum,
C - Cracks in glass or improper glass,
coverage along edge of aluminum
.
MIL-STD-883F
METHOD 2021.3
29 November 1985
6
FIGURE 2021-7. Etched device exhibiting category D defects
pinholes in glass over aluminum
.