MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第43页

MIL-STD-883F METHOD 1006 1 May 1968 1 METHOD 1006 INTERMITTENT LIFE 1. PURPOSE . The int ermit tent li fe tes t is perfor med for the purpos e of determi ning a repr esentat ive fai lure r ate for micr oelect ronic devic…

MIL-STD-883F

METHOD 1005.8

1 June 1993

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MIL-STD-883F

METHOD 1006

1 May 1968

METHOD 1006

INTERMITTENT LIFE

1. PURPOSE

. The intermittent life test is performed for the purpose of determining a representative failure rate for

microelectronic devices or demonstrating quality or reliability of devices subjected to the specified conditions. It is intended

for applications where the devices are exposed to cyclic variations in electrical stresses between the "on" and "off" condition

and resultant cyclic variations in device and case temperatures.

2. APPARATUS

. See method 1005 of this standard.

3. PROCEDURE

. The device shall be tested in accordance with all the requirements of method 1005 except that all

electrical stresses shall be alternately applied and removed. The "on" and "off" periods shall be initiated by sudden, not

gradual, application or removal of the specified electrical inputs (including signal and bias).

4. SUMMARY

. In addition to the requirements of method 1005 of this standard, the following detail shall be specified in

the applicable acquisition document:

Frequency and duration of "on" and "off" cycles

MIL-STD-883F

METHOD 1006

1 May 1968

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