MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第437页
MIL-STD-883F METHOD 2032.2 18 June 2004 31 C lass H Cla ss K 3.1. 7 d. No nic king or scor ching i s all owed except as 3.1.7 d. Same as clas s H. permitt ed below. NOTE: This does not appl y to rungs in a fine r esis to…
MIL-STD-883F
METHOD 2032.2
18 June 2004
30
Class H Class K
3.1.7 c. Bridging of detritus between rungs in the 3.1.7 c. Same as class H.
active area of a resistor ladder structure
(see figure 2032-26h).
NOTE: Bridging of detritus in inactive
areas is acceptable.
FIGURE 2032-26h. Bridging of detritus between rungs in the active area of a
resistor ladder structure criterion
.
MIL-STD-883F
METHOD 2032.2
18 June 2004
31
Class H Class K
3.1.7 d. No nicking or scorching is allowed except as 3.1.7 d. Same as class H.
permitted below.
NOTE: This does not apply to rungs in a
fine resistor ladder structure (see figure
2032-27h).
NOTE: See 3.i.(33) for a definition of
coarse and fine resistor ladder structures.
The element drawing must be referenced to
determine if a given resistor ladder
structure is coarse or fine.
FIGURE 2032-27h. Class H resistor ladder structure nicking and scorching criteria exceptions
.
MIL-STD-883F
METHOD 2032.2
18 June 2004
32
Class H Class K
3.1.7 d. (Continued.)
NOTE: This criteria does not apply to the
second rung of a resistor loop since the
second rung is inactive. This criteria
does not apply to a fine loop or to a
resistor structure that is comprised of fine
loops (see figure 2032-28h).
NOTE: See 3.i.(35) for a definition of
coarse and fine resistor loop structures.
The element drawing must be referenced
to determine if a given resistor loop
structure is coarse or fine.
FIGURE 2032-28h. Class H resistor loop nicking and scorching criteria exceptions
.