MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第45页
MIL-STD-883F METHOD 1007 1 May 1968 1 METHOD 1007 AGREE LIFE 1. PURPOSE . The purpos e of thi s tes t is to deter mine a repr esentati ve fail ure rat e for mi croel ectr onic devi ces or to demo nstrate q uality o r rel…
MIL-STD-883F
METHOD 1006
1 May 1968
2
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MIL-STD-883F
METHOD 1007
1 May 1968
1
METHOD 1007
AGREE LIFE
1. PURPOSE
. The purpose of this test is to determine a representative failure rate for microelectronic devices or to
demonstrate quality or reliability of devices subjected to the specified conditions where test conditions include a combination
of temperature cycling, on-off electrical stressing and vibration to simulate as closely as possible actual system applications
and environments.
2. APPARATUS
. The apparatus required shall be described in method 1005 of this standard except that the temperature
chambers shall be capable of following the specified test profile of figures 1 or 2 of MIL-STD-781 and suitable equipment
shall be provided to satisfy the requirements for vibration as specified.
3. PROCEDURE
. This test shall be conducted in accordance with all the requirements of method 1005 of this standard
with the exceptions that temperature shall be cycled, periodic vibration shall be applied, and electrical stresses shall be
applied in on-off cycles where and as required in the specified test level of MIL-STD-781. Only test levels E, F, G, H and J
of MIL-STD-781 shall be considered acceptable as test conditions. Selection of the temperature range should take into
account the temperature rise associated with the devices under test.
Test conditions
for method 1007
Test level
in accordance with
MIL-STD-781
Temperature range
°C
A E -54 to +55
B F -54 to +71
C G -54 to +95
D H -65 to +71
E J -54 to +125
F Test level F with
modified low
temperature
0 to +70
4. SUMMARY
. In addition to the requirements of method 1005 of this standard, the following details shall be specified in
the applicable acquisition document:
a. Test condition (see 3).
b. Test profile, specify figure 1 or 2 MIL-STD-781 and specify on-time and transfer-times, as applicable.
c. Total on-time
MIL-STD-883F
METHOD 1007
1 May 1968
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