MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第491页

MIL-STD-883F METHOD 3006.1 15 November 1974 1 METHOD 3006.1 HIGH LEVEL OUTPUT VOLTAGE 1. PURPOSE . This method est ablis hes the means for as suri ng cir cuit perfor mance to t he limi ts s pecif ied in the applic able a…

100%1 / 708
MIL-STD-883F
METHOD 3005.1
15 November 1974
2
4. SUMMARY. The following details shall be specified in the applicable acquisition document:
a. Test temperature.
b. Power supply voltages.
c. I
CCH
, I
CCL,
I
DD
, I
GG
, and I
EE
limits.
d. Conditioning voltages.
e. Dynamic input parameters (see 3.11).
MIL-STD-883F
METHOD 3006.1
15 November 1974
1
METHOD 3006.1
HIGH LEVEL OUTPUT VOLTAGE
1. PURPOSE
. This method establishes the means for assuring circuit performance to the limits specified in the
applicable acquisition document in regard to HIGH level output drive, which may be specified as a minimum value V
OH
min.
or as a maximum V
OH
max. This method applies to digital microelectronic devices, such as TTL, DTL, RTL, ECL, and MOS.
2. APPARATUS
. The test instrument shall be capable of loading the output of the circuit under test with the specified
positive or negative currents (I
OH
). Resistors may be used to simulate the applicable current levels. The test instrument
shall also be capable of supplying the worst case power supply and input voltages. The test chamber shall be capable of
maintaining the device under test at any specified test temperature.
3. PROCEDURE
. The device shall be stabilized at the specified test temperature. Worst case power supply voltages and
worst case input levels including guaranteed noise margins shall be applied to the test circuit to provide a HIGH level output.
Forcing current, equal to the circuit worst case high level fan out, shall then be applied to the test circuit output terminal and
the resultant output voltage measured. The output measurement shall be made after each input is conditioned.
4. SUMMARY
. The following details shall be specified in the applicable acquisition document:
a. Test temperature.
b. Current to be forced from or into output terminal.
c. Power supply voltage(s).
d. Input levels.
e. V
OH
min. or V
OH
max. limits.
MIL-STD-883F
METHOD 3006.1
15 November 1974
2
This page intentionally left blank