MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第511页
MIL-STD-883F METHOD 3013.1 15 November 1974 7 FIGURE 3013- 3. Noninvert ing logi c gate t ransf er char acter ist ic def ining t est poi nts .
MIL-STD-883F
METHOD 3013.1
15 November 1974
6
FIGURE 3013-2. Inverting logic gate transfer characteristic defining test points
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MIL-STD-883F
METHOD 3013.1
15 November 1974
7
FIGURE 3013-3. Noninverting logic gate transfer characteristic defining test points
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MIL-STD-883F
METHOD 3013.1
15 November 1974
8
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