MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第514页

MIL-STD-883F METHOD 3014 15 November 1974 2 This page i ntenti onally lef t blank

MIL-STD-883F

METHOD 3014

15 November 1974

METHOD 3014

FUNCTIONAL TESTING

1. PURPOSE

. This method establishes the means for assuring circuit performance in regard to the test requirements

necessary to verify the specified function and to assure that all logic element paths are not open, stuck-at-HIGH level or

stuck- at-LOW LEVEL. This method applies to digital microelectronic devices, such as TTL, DTL, RTL, ECL, and MOS.

2. APPARATUS

. An instrument shall be provided which has the capability of applying logic patterns (sequentially, if

specified) to the logic network input(s) in accordance with the applicable acquisition document. The test instrument shall

also be capable of applying nominal power supply voltages and monitoring the outputs for the specified logic levels. The

output monitoring circuit may be either a single or double comparator type. The threshold voltage (trip point) for a single

comparator or V

(max) and V

(min) for a double comparator shall be specified in the applicable acquisition document.

The test chamber shall be capable of maintaining the device under test at any specified test temperature.

3. PROCEDURE

. The device shall be stabilized at the specified test temperature. Nominal power supply voltages and

the specified input logic patterns shall be applied to the logic network under test and the output(s) monitored.

4. SUMMARY

. The following details shall be specified in the applicable acquisition document:

a. Test temperature.

b. Power supply voltage.

c. Input voltage levels.

d. Input and output logic patterns.

e. Output threshold voltage (see 2).

f. V

(min) and V

(max) (see 2).

MIL-STD-883F

METHOD 3014

15 November 1974

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MIL-STD-883F

METHOD 3015.7

22 March 1989

METHOD 3015.7

ELECTROSTATIC DISCHARGE SENSITIVITY CLASSIFICATION

1. PURPOSE

. This method establishes the procedure for classifying microcircuits according to their susceptibility to

damage or degradation by exposure to electrostatic discharge (ESD). This classification is used to specify appropriate

packaging and handling requirements in accordance with MIL-PRF-38535, and to provide classification data to meet the

requirements of MIL-STD-1686.

1.1 Definition

. The following definition shall apply for the purposes of this test method.

1.1.1 Electrostatic discharge (ESD)

. A transfer of electrostatic charge between two bodies at different electrostatic

potentials.

2. APPARATUS

2.1 Test apparatus

. ESD pulse simulator and device under test (DUT) socket equivalent to the circuit of figure 3015-1,

and capable of supplying pulses with the characteristics required by figure 3015-2.

2.2 Measurement equipment

. Equipment including an oscilloscope and current probe to verify conformance of the

simulator output pulse to the requirements of figure 3015-2.

2.2.1 Oscilloscope and amplifier

. The oscilloscope and amplifier combination shall have a 350 MHz minimum bandwidth

and a visual writing speed of 4 cm/ns minimum.

2.2.2 Current probe

. The current probe shall have a minimum bandwidth of 350 MHz (e.g., Tektronix CT-1 at 1,000 MHz).

2.2.3 Charging voltage probe

. The charging voltage probe shall have a minimum input resistance of 1,000 M and a

division ratio of 4 percent maximum (e.g., HP 34111A).

2.3 Calibration

. Periodic calibration shall include but not be limited to the following.

2.3.1 Charging voltage

. The meter used to display the simulator charging voltage shall be calibrated to indicate the actual

voltage at points C and D of figure 3015-1, over the range specified in table I.

2.3.2 Effective capacitance

. Effective capacitance shall be determined by charging C1 to the specified voltage (with table

I), with no device in the test socket and the test switch open, and by discharging C1 into an electrometer, coulombmeter, or

calibrated capacitor connected between points A and B of figure 3015-1. The effective capacitance shall be 100 pF ±10

percent over the specified voltage range and shall be periodically verified at 1,000 volts. (Note: A series resistor may be

needed to slow the discharge and obtain a valid measurement.)

2.3.3 Current waveform

. The procedure of 3.2 shall be performed for each voltage step of table I. The current waveform

at each step shall meet the requirements of figure 3015-2.

2.4 Qualification

. Apparatus acceptance tests shall be performed on new equipment or after major repair. Testing shall

include but not be limited to the following.

2.4.1 Current waveform verification

. Current waveform shall be verified at every pin of each test fixture using the pin

nearest terminal B (see figure 3015-1) as the reference point. All waveforms shall meet the requirements of figure 3015-2.

The pin pair representing the worst case (closest to the limits) waveform shall be identified and used for the verification

required by 3.2.

3. PROCEDURE

3.1 General

3.1.1 Test circuit

. Classification testing shall be performed using a test circuit equivalent to figure 3015-1 to produce the

waveform shown on figure 3015-2.