MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第543页
MIL-STD-883F METHOD 3023.1 5 November 1999 1 METHOD 3023.1 STATIC LATCH-UP MEASUREMENTS FOR DIGITAL CMOS MICROELECTRONI C DEVICES Latchup s hall be per formed i n accor dance wit h EIA/JESD78 dat ed March 1997. EIA/J ESD…
MIL-STD-883F
METHOD 3022
29 May 1987
2
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MIL-STD-883F
METHOD 3023.1
5 November 1999
1
METHOD 3023.1
STATIC LATCH-UP MEASUREMENTS
FOR DIGITAL CMOS MICROELECTRONIC DEVICES
Latchup shall be performed in accordance with EIA/JESD78 dated March 1997. EIA/JESD78 supersedes JEDEC-STD-17.
MIL-STD-883F
METHOD 3023
5 November 1999
2
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