MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第559页

MIL-STD-883F METHOD 4002.1 22 March 1989 3 FI GURE 4002-1. Tes t set up noninvert ing amplif ier . FIGURE 4002-2. Amplitude of E o . FIGURE 4002-3. Test s etup si ngle ended invert ing ampli fier .

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MIL-STD-883F
METHOD 4002.1
22 March 1989
2
4. SUMMARY
. The following details shall be specified in the applicable acquisition document for specified values of R
1
,
R
2
, and V
1
.
a. Maximum peaking.
b. Maximum rise time for E
0
positive pulses.
c. Maximum fall time for E
0
positive pulses.
d. Maximum rise time for E
0
negative pulses.
e. Maximum fall time for E
0
negative pulses.
f. Test temperature(s). Unless otherwise specified, all parameters shall be measured at the minimum and maximum
specified ambient operating temperatures and at 25°C ambient.
MIL-STD-883F
METHOD 4002.1
22 March 1989
3
FIGURE 4002-1. Test setup noninverting amplifier
.
FIGURE 4002-2. Amplitude of E
o
.
FIGURE 4002-3. Test setup single ended inverting amplifier
.
MIL-STD-883F
METHOD 4002.1
22 March 1989
4
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