MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第581页

MIL-STD-883F METHOD 5002.1 15 August 1984 1 METHOD 5002.1 PARAMETER DISTRI BUTION CONTROL 1. PURPOSE . The purpos e of thi s method i s to def ine a tec hnique for as sur ing a normal dist ributi on for any t est met hod…

MIL-STD-883F

METHOD 5001

20 November 1969

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MIL-STD-883F

METHOD 5002.1

15 August 1984

METHOD 5002.1

PARAMETER DISTRIBUTION CONTROL

1. PURPOSE

. The purpose of this method is to define a technique for assuring a normal distribution for any test method

listed in the 3000 or 4000 series of this standard. This method is not intended for general application to acquisitions where it

is important only to assure that device parameters are between specified limits. It is intended for use only where it is

necessary to control the distribution of parameter values within the specified group. When this method is employed, it is

expected that the specified group of devices tested will be packaged for shipment as a group together with the required data.

It is also expected that some provisions will be required for special marking of devices subjected to this method to identify

that they have met the selection criteria involved and that they are therefore not directly interchangeable with identical

devices which have not been controlled or selected in this manner.

2. APPARATUS

. For distribution control, it is desirable for the measuring equipment, in addition to the capabilities listed

in section 3000 and 4000, to have the capability of rejecting and counting the devices above or below the specified extreme

limits, and to also separate and count the devices that fall above or below the sigma limits. If the equipment does not have

this capability, the units shall be read to the specified parameter conditions and the data recorded. Identification of units to

the data shall also be required. Data analysis and unit separation shall be hand performed in the case where automatic

equipment is not used.

3. PROCEDURE

. Microelectronic devices shall be separated into groups. Each group will be tested, in accordance with

the specific method for the maximum and minimum limits specified in the applicable acquisition document. All failures will

be removed from the original group. The remaining units will be tested for the following: Not less than 12 percent but not

greater than 18 percent of units tested will fall below the mean -1σ limit. Not greater than 18 percent but not less than 12

percent of units tested will fall above the mean +1σ limit.

4. SUMMARY

. The following details must be specified in the applicable acquisition document:

a. Absolute maximum and minimum limits.

b. Mean value.

c. +1σ and -1σ value.

d. Group size.

e. Requirements for data logging, special markings, and special provisions for packaging and shipment, where

applicable.

MIL-STD-883F

METHOD 5002.1

15 August 1984

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