MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第620页

MIL-STD-883F METHOD 5005.14 18 June 2004 4 TABLE I. Gr oup A electr ical test s for clas ses level S and level B devices . 1/ Subgroups 2 / Qualit y/acc ept no. = 116/ 0 3 / 4/ 5 / Subgroup 1 Stati c tes ts at 25°C Subgr…

100%1 / 708
MIL-STD-883F
METHOD 5005.14
18 June 2004
3
3.5.1.1 Inspection lot sample selection. When this option is used, test samples for each individual group A subgroup
shall be randomly selected from the inspection lot after 100 percent screening of that subgroup (or subgroups, in the event
that multiple subgroups are tested at the same temperature in sequence with the same test program). All devices in the
inspection lot or sublot shall be available for selection as a test sample and a fully random sample shall be selected from the
total population of devices.
3.5.1.2 Concurrent sample selection
. When this option is used, test samples from each individual group A subgroup(s)
shall be randomly selected concurrent with the 100 percent screening of that subgroup(s) and tested subsequent to
screening each individual device of that subgroup(s). When this option is used, the following requirements apply:
a. A documented verification methodology and operating procedure shall be set up to assure the integrity of the total
test system, that the product is being tested with correct test conditions and that all required screening and group
A testing is being performed.
b. The group A samples shall be sorted out separately from the balance of the lot and the sample size verified. If
because of higher than expected yield loss, the number of samples tested are less than the required sample size,
(116 units), then additional samples shall be randomly selected and tested.
c. Each group A reject shall be sorted out separately.
d. All screening rejects shall be segregated from the acceptable product and the physical count verified against the
test system attribute data.
e. When sorting (e.g., speed or power) is completed during the final electrical screening, each individual device type
screened shall have a full group A sample selected and tested.
f. For small lots, where the lot size is less than the required sample size (116 units) each device in the lot shall be
double tested (i.e., 100 percent screening and 100 percent group A).
MIL-STD-883F
METHOD 5005.14
18 June 2004
4
TABLE I. Group A electrical tests for classes level S and level B devices. 1/
Subgroups 2
/
Quality/accept no. = 116/0 3
/ 4/ 5/
Subgroup 1
Static tests at 25°C
Subgroup 2
Static tests at maximum rated operating temperature
Subgroup 3
Static tests at minimum rated operating temperature
Subgroup 4
Dynamic tests at 25°C
Subgroup 5
Dynamic tests at maximum rated operating temperature
Subgroup 6
Dynamic tests at minimum rated operating temperature
Subgroup 7
Functional tests at 25°C
Subgroup 8A
Functional tests at maximum rated operating temperatures
Subgroup 8B
Functional tests at minimum rated operating temperatures
Subgroup 9
Switching tests at 25°C
Subgroup 10
Switching tests at maximum rated operating temperature
Subgroup 11
Switching tests at minimum rated operating temperature
See footnotes at top of next page.
MIL-STD-883F
METHOD 5005.14
18 June 2004
5
TABLE I. Group A electrical tests for classes level S and level B devices - Continued. 1/
1
/ The specific parameters to be included for tests in each subgroup shall be as specified in the applicable acquisition
document. Where no parameters have been identified in a particular subgroup or test within a subgroup, no group
A testing is required for that subgroup or test to satisfy group A requirements.
2
/ At the manufacturer's option, the applicable tests required for group A testing (see 1/) may be conducted individually
or combined into sets of tests, subgroups (as defined in table I), or sets of subgroups. However, the manufacturer
shall predesignate these groupings prior to group A testing. Unless otherwise specified, the individual tests,
subgroups, or sets of tests/subgroups may be performed in any sequence.
3
/ The sample plan (quantity and accept number) for each test, subgroup, or set of tests/subgroups as predesignated
in 2
/, shall be 116/0.
4
/ A greater sample size may be used at the manufacturer's option; however, the accept number shall remain at zero.
When the (sub)lot size is less than the required sample size, each and every device in the (sub)lot shall be
inspected and all failed devices removed from the (sub)lot for final acceptance of that test, subgroup, or set of
tests/subgroups, as applicable.
5
/ If any device in the sample fails any parameter in the test, subgroup, or set of tests/subgroups being sampled, each
and every additional device in the (sub)lot represented by the sample shall be tested on the same test set-up for all
parameters in that test, subgroup, or set of tests/subgroups for which the sample was selected, and all failed
devices shall be removed from the (sub)lot for final acceptance of that test, subgroup, or set of tests/subgroups, as
applicable. For class level S only, if this testing results in a percent defective greater than 5 percent, the (sub)lot
shall be rejected, except that for (sub)lots previously unscreened to the tests that caused failure of this percent
defective, the (sub)lot may be accepted by resubmission and passing the failed individual tests, subgroups, or set of
tests/subgroups, as applicable, using a 116/0 sample.