MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第693页
MIL-STD-883F METHOD 5011.4 31 October 1995 13 3.8.17 Oper ating li fe tes t . Ten elect rical ly func tioning s amples shall be fabr ic ated usi ng hermeti call y sealed devic es which have b een proc ess ed through t he…
MIL-STD-883F
METHOD 5011.4
31 October 1995
12
3.8.16 Mechanical integrity.
3.8.16.1 Getter integrity - short term
. Samples shall be prepared using hermetically sealed packages representative of
the maximum size and type which will incorporate the use of getter material. These samples will contain only "salted"
particles and getter material. The getter material shall be applied to the package in the location and approximate volume as
specified for a normal production part. The getter material coverage area shall be measured and recorded. The particles to
be salted shall consist of the following unless otherwise agreed upon by the user and the qualifying activity.
(1) Solder balls: 3-6 mils in diameter - 2 pieces required.
(2) Aluminum ribbon: Approximate dimensions of 2 mil thick by 5 mil wide by 10 mils long - 1
required. A piece of aluminum wire 2-6 mils in diameter may be substituted for the ribbon.
(3) Gold wire: 1 mil diameter by 15-20 mils in length - 1 piece required. Getter material
application and cure shall take place in the sequence normally followed for production parts.
The samples shall be processed through the same environmental conditioning steps as a
qualified production part. The samples shall be subjected to PIND test in accordance with
MIL-STD-883, method 2020, condition A or B, which shall be repeated three time for a total
of four cycles to verify the integrity of the getter material. During all PIND testing the
samples shall be mounted on the tester such that the shock pulses integral with the test
shall be in the direction most likely to dislodge the particles from the getter material. A
minimum of three samples shall be evaluated and all shall pass the defined PIND criteria.
3.8.16.2 Getter integrity - long term.
All of the conditions and requirements of 3.8.16.1 apply, except that the samples
either newly prepared or as received from the short term test, shall be stored at 150°C for 1,000 hours.
The samples shall then be subjected to mechanical shock in accordance with MIL-STD-883, method 2002, condition B,
in the Y
2
direction. Following mechanical shock the samples shall be PIND tested as specified above.
Following PIND, the samples shall be delidded and a visual inspection shall be performed to verify the following:
a. Determine if particles have separated from the getter material or have fallen into the package.
b. Determine if getter coverage has spread or bled out.
c. Check for any evidence of peeling from inside and/or getter becoming separated from package.
3.8.16.3 Vibration
. Samples shall be prepared as in 3.8.16.1 except that the lid shall be attached in such a manner that it
may be removed for visual inspection. After particle salting and immobilization as in 3.8.16.1, visual inspection shall be
done to verify entrapment of the salted particles. Location of the particles in the getter material shall be recorded for future
reference.
The lid shall then be reattached to the package securely enough to withstand the testing that follows. After PIND testing
in accordance with MIL-STD-883, method 2020, the samples shall be subjected to vibration in accordance with MIL-STD-
883, method 2007, condition A or B. At the end of this test, the lids shall be removed from the package by whatever
method is required. Location of the "salted" particles in the getter material shall be noted and compared with the location
prior to vibration. Particles other than the original "salted" particles shall be ignored. A minimum of three samples shall be
submitted for evaluation and all shall pass the defined PIND criteria initially and after vibration.
MIL-STD-883F
METHOD 5011.4
31 October 1995
13
3.8.17 Operating life test
. Ten electrically functioning samples shall be fabricated using hermetically sealed devices
which have been processed through the same steps as a normally qualified production part as specified by the user's
assembly drawing. If agreed upon by the user and the qualifying activity, standard evaluation circuits may be substituted.
All the samples shall meet the PIND test requirements in accordance with MIL-STD-883, method 2020, condition A or B.
The samples shall be subjected to the life test in accordance with MIL-STD-883, method 1005, condition A, for 1,000 hours
at 125°C. Electrical parameters shall be measured and recorded for the units initially and at the completion of the life test.
Data taken from the samples shall be reviewed for evidence of device degradation due to the presence of getter material.
NOTE: Qualification test data may be used to satisfy this requirement with qualifying activity approval.
3.9 Test deviation
. Additional, reduced or alternate testing, as may be dictated by the uniqueness of particular material
and manufacturing construction techniques can be required or authorized by the qualifying activity provided the
manufacturer submits data to support test deviation.
4. SUMMARY
. As a minimum, acquisition documents shall specify the following information:
a. Title, number, and revision letter of acquisition specification.
b. Size and number of containers required.
c. Manufacturer's product designation.
d. Request for test data.
MIL-STD-883F
METHOD 5011.4
31 October 1995
14
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