MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第7页

MIL-STD-883F 1 1. SCOPE 1.1 Purpos e . This standar d establ ishes unifor m methods, contr ols, and proc edures f or tes ting mic roelec troni c devic es suitab le for use w ithin Military and Aerospac e elec tronic sys …

MIL-STD-883F

TEST METHODS

METHOD NO. TEST PROCEDURES

5001 Parameter mean value control

5002.1 Parameter distribution control

5003 Failure analysis procedures for microcircuits

5004.11 Screening procedures

5005.14 Qualification and quality conformance procedures

5006 Limit testing

5007.6 Wafer lot acceptance

5008.9 Test procedures for hybrid and multichip microcircuits

5009.1 Destructive physical analysis

5010.4 Test procedures for custom monolithic microcircuits

5011.4 Evaluation and acceptance procedures for polymeric adhesives.

5012.1 Fault coverage measurement for digital microcircuits.

5013 Wafer fabrication control and wafer acceptance procedures for processed GaAs wafers

MIL-STD-883F

1. SCOPE

1.1 Purpose

. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices

suitable for use within Military and Aerospace electronic systems including basic environmental tests to determine

resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical

and electrical tests; workmanship and training procedures; and such other controls and constraints as have been deemed

necessary to ensure a uniform level of quality and reliability suitable to the intended applications of those devices. For the

purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits,

microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only

to microelectronic devices. The test methods, controls, and procedures described herein have been prepared to serve

several purposes:

a. To specify suitable conditions obtainable in the laboratory and at the device level which give test results equivalent

to the actual service conditions existing in the field, and to obtain reproducibility of the results of tests. The tests

described herein are not to be interpreted as an exact and conclusive representation of actual service operation in

any one geographic or outer space location, since it is known that the only true test for operation in a specific

application and location is an actual service test under the same conditions.

b. To describe in one standard all of the test methods of a similar character which now appear in the various

joint-services and NASA microelectronic device specifications, so that these methods may be kept uniform and thus

result in conservation of equipment, manhours, and testing facilities. In achieving this objective, it is necessary to

make each of the general tests adaptable to a broad range of devices.

c. To provide for a level of uniformity of physical, electrical and environmental testing; manufacturing controls and

workmanship; and materials to ensure consistent quality and reliability among all devices screened in accordance

with this standard.

1.2 Intended use of or reference to MIL-STD-883

. When this document is referenced or used in conjunction with the

processing and testing of JAN devices in conformance with the requirements of appendix A of

MIL-PRF-38535, QML devices in conformance with MIL-PRF-38535 or non-JAN devices in accordance with 1.2.1 or 1.2.2

herein, such processing and testing shall be in full conformance with all the applicable general requirements and those of

the specifically referenced test methods and procedures.

For contracts negotiated prior to 31 December 1984, device types that have been classified as manufacturer's 883 (B or S)

product prior to 31 December 1984 shall not have to meet 1.2.1 or 1.2.2.

Existing contracts as of the 31 December 1984, previously negotiated add-ons to these contracts, and future spares for

these contracts may continue to use device types which were classified as manufacturer's 883

(B or S) prior to 31 December 1984.

New contracts, and any device types classified as compliant to MIL-STD-883 after 31 December 1984 shall comply with

1.2.1. Any devices meeting only the provisions of 1.2.2 are noncompliant to MIL-STD-883.

MIL-STD-883F

1.2.1 Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices

. When any manufacturer,

contractor, subcontractor, or original equipment manufacturer requires or claims a non-JAN part compliant with

MIL-STD-883, all provisions of Appendix A of MIL-PRF-38535 shall be met. In addition, manufacturers that have produced

or are producing products in accordance with 1.2.1a are subject to a Government compliance validation audit on a drop-in

basis with a minimum of notice. Such processing and testing shall be in compliance with all of the applicable general

controls and requirements defined herein and those of the specifically referenced test methods and procedures with no

reinterpretations, deviations or omissions except as specifically allowed in the device specification or standard microcircuit

drawing covering the same generic device. Deviations specifically granted in the device specification or standard

microcircuit drawing may also be applied to devices manufactured in the same process, to the same design criteria, and

using elements of the same microcircuit group as those used for devices covered by the device specification or standard

microcircuit drawing. Such reference include the following:

Manufacturers who use MIL-STD-883 in device marking, or make statements in applicable certificates of

conformance that parts are compliant with MIL-STD-883, or make statements in advertisements or in published

brochures or other marketing documents that parts provided are compliant with MIL-STD-883.

Contractors, sub-contractors, or original equipment manufacturers who prepare vendor item drawings,

(previously called Specification Control drawings), or Selected Item drawings which require compliance with

MIL-STD-883, or invoke it in its entirety as the applicable standard (see 1.2.2 for noncompliant devices).

a. Custom monolithic, non-JAN multichip and all other non-JAN microcircuits except non-JAN hybrids described or

implied to be compliant with methods 5004 and 5005 or 5010 of MIL-STD-883 shall meet all of the non-JAN

requirements of Appendix A of MIL-PRF-38535.

b. Hybrid microcircuits described as compliant or multichip microcircuits described as compliant to MIL-PRF-38534

shall meet all the requirements of MIL-PRF-38534 (or equivalent procedures/ requirements of reciprocal listing

provisions for product of other nations based on existing international agreements):

1.2.2 Provisions for the use of MIL-STD-883 in conjunction with non-compliant non -JAN devices

. Any device that is

processed with deviations and which is not processed in compliance with the provisions of 1.2.1 defined herein shall not be

claimed to be compliant and shall not be marked "/883", "/883B", "/883S", or any variant thereof. All applicable

documentation (including device specifications or manufacturer's data sheets and responses to RFQ's invoking

MIL-STD-883) shall clearly and specifically define any and all areas of nonconformance and identify them as deviations in

language that is not subject to misinterpretation by the acquiring authority.

If the contract or order specifically requires compliance with, equivalence to, or a product that is equal to or better than

MIL-STD-883 class B or class S, any exceptions taken to the requirements of the referenced quality level (i.e., 1.2.1 above)

shall prohibit the manufacturer from claiming or implying equivalence to that level.

Specific reference to one or more MIL-STD-883 method(s) on a stand-alone basis requires compliance to only the

specifically referenced method(s). Such devices are not considered compliant in accordance with 1.2.1 above. However,

compliance with only the test procedures contained in test methods 5004, 5005, and 5010 on a stand-alone basis (without

specifying compliance or noncompliance to 1.2.1) does not satisfy the requirement for form, fit, and function defined in MIL-

PRF-38535 for configuration items, and any reference to these methods on a stand alone basis requires compliance to all

the provisions of 1.2.1.