MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第75页
MIL-STD-883F METHOD 1012.1 4 November 1980 11 FIGURE 1012-2. Temperature ar rangement f or mounti ng surf ace temper ature meas urements .
MIL-STD-883F
METHOD 1012.1
4 November 1980
10
FIGURE 1012-1. Temperature controlled heat sink
- Continued.
MIL-STD-883F
METHOD 1012.1
4 November 1980
11
FIGURE 1012-2. Temperature arrangement for mounting surface temperature measurements
.
MIL-STD-883F
METHOD 1012.1
4 November 1980
12
TSP: Diode V
F
- Switch S1 in position 2
Switch S2 in position 1
Transistor V
EB
(Emitter-only switching) - Switch S1 in position 2
Switch S2 in position 2
Switch S3 in position 2
Transistor V
EB
(Emitter and collector switching) - Switch S1 in position 2
Switch S2 in position 2
Switch S1 in position 1
Transistor V
CB
- Switch S1 in position 1
Switch S2 in position 2
Switch S3 in position 1
FIGURE 1012-3. Typical test circuit for indirect measurement of T
J(Avg)
using
p-n junction voltages of active devices
.