MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS - 第77页
MIL-STD-883F METHOD 1012.1 4 November 1980 13 FIGURE 1012-4. Typical t est c irc uit f or indir ect meas urement of T J(Regi on) using the subs trat e diode of junc tion i solat ed integr ated ci rcui t .
MIL-STD-883F
METHOD 1012.1
4 November 1980
12
TSP: Diode V
F
- Switch S1 in position 2
Switch S2 in position 1
Transistor V
EB
(Emitter-only switching) - Switch S1 in position 2
Switch S2 in position 2
Switch S3 in position 2
Transistor V
EB
(Emitter and collector switching) - Switch S1 in position 2
Switch S2 in position 2
Switch S1 in position 1
Transistor V
CB
- Switch S1 in position 1
Switch S2 in position 2
Switch S3 in position 1
FIGURE 1012-3. Typical test circuit for indirect measurement of T
J(Avg)
using
p-n junction voltages of active devices
.
MIL-STD-883F
METHOD 1012.1
4 November 1980
13
FIGURE 1012-4. Typical test circuit for indirect measurement of T
J(Region)
using
the substrate diode of junction isolated integrated circuit
.
MIL-STD-883F
METHOD 1012.1
4 November 1980
14
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