C_TR5001 SII SERIES_EN

INLINE/MANUAL HANDLER ICT WITH FUNCTIONAL TEST TR5001 SII SERIES MUL TI CORE SERIES • Multi-Core Parallel T est • Non-Multiplexing 1:1 per Pin Architectur e • Scalable MDA to ICT and Functional T est • High Accuracy and …

INLINE/MANUAL HANDLER

ICT WITH FUNCTIONAL TEST

TR5001 SII SERIES

MULTI CORE SERIES

• Multi-Core Parallel Test

• Non-Multiplexing 1:1 per Pin Architecture

• Scalable MDA to ICT and Functional Test

• High Accuracy and High Throughput

• Durable Quick Disconnection Interface

• Automatic Conveyor Width Positioning

• Board Warp and Mis-Alignment Notication

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Multi-program Testing

A B C D

Quad-core ICT

A B C D

Dual-core ICT

A B

The Next Generation In-Circuit Test Strategy

Non-Multiplexing Pin Design, 1:1 Driver/Receiver to Pin Ratio.

• Optimized Nail Placement with 1:1 Ratio Flexibility

• 1:1 per-pin Driver/Receiver ratio for the fastest test program development and debugging

• Improved Test Accuracy and Capability

The most flexible ICT+FCT solution in the market. TR5001 SII series can integrate with

external instruments for functional tests such as: PXI, Labview, ....etc.

Multi-Core Parallel Testing Design

The new TR5001 SII series testers support up to four independent test cores for high-throughput

parallel testing. Depending on tested product complexity, tester cores can be merged to test

higher pin-count boards.

Multiple Serial Bus Access

The TR5001 SII testers feature a new Serial Test Controller, which offers two high-speed serial

ports per tester core, for a maximum of 8 individual ports. Each of these serial ports can be

mapped to any test pin on TR5001 SII’s Hybrid Switching Board and deliver a variety of Serial Bus

protocols (I

C, SPI, UART, JTAG) to the DUT.

TR5001 SII SERIES

FEATURES

TR5001 SII Series

• R, L, C Measurement

• 6-Wire Measurement

• Auto-Guarding Feature

• AC Phase Measurement

• TRI Enhanced TestJet

Detects open connections on ICs,

connectors and other SMT devices.

• Transistor/Diode Measurement

• Full digital in-circuit test (ICT)

• Friendly UI

• On-Board Programming

• Boundary Scan

Auto-Generation of test programs

• Frequency Counter

• LED Testing

TRI Enhanced TestJet

1:1 Per-pin Driver & Receiver Up to 8 Serial Ports can be Mapped to any Pin

Real Image Display

Flash Programming

Clear Parallel Test

Interface

Customizable Test Plan

Driver

Vih

Vterm

Receiver

Digital Pin

STC

BACKPLANE

HSWB128

CORE A

DUT

C/SPI/UART/JTAG)

HSWB128 HSWB128

CORE B

DUT

C/SPI/UART/JTAG)

HSWB128

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•

Inspection results and data integration

•

Real time SPC and production yield

management

•

Quality reports and closed loop tracking

•

Support defect component analysis

and improvements

•

Knowledge Management (KM)

•

Productivity and Quality Management

Yield Management System

TR518 SII Series

TR5000 Series

Data Flow

Screen Print

Pick & Place

Reow Oven

Insertion & Wave

Soldering

Data

Interface

Intelligent

Integrated S/W

with YMS

SFC/MES

Feedback Flow

TR7007 Series

TR8000 Series

TR7500 Series or

TR7700 Series

TR7500 Series or

TR7700 Series

TR7600 Series

Limited Access Test Solutions

Drive Through Test

Greatly reduces test probes for passive analog

components connected in series with JTAG and

BScan capable devices and connectors.

Boundary Scan Test

Virtual nails tests for RAM,

ROM, TTL and TREE

devices, and IEEE1149.6

Test.

Boundary Scan Virtual Chain Test using BSCAN2 Module

Simplify chained DUT testing

using software TAP routing in TRI

Virtual Chain BScan Test. Reduce

fixture wiring and test program

complexity.

TRI ToggleScan

Test

A Powerful vectorless test technology that significantly reduces the number of test probes,

ToggleScan utilizes BScan and vectorless probes to test non-BScan devices.

Shop Floor System Support

TR5001 SII Series can integrate with many shop floor systems to help centralize production line

management and improve production quality using gathered testing data.

Intelligent Software Interface

The TR5001 SII Series features an intuitive

software interface designed for easy operation

and programming. Enhanced Automated

features include Automated Test Program

Generator, Auto-tuning, and setting templates.

ATPG

The advanced programming assistant helps generate fixture wiring and test programs based on

CAD data and BOM input files.

Easy Debugging

The new test program debugging interface supports flow-based test program debugging of

individual or parallel test programs. Using multiple cores, it is now possible to debug both panel

boards or individual boards.

No test probes needed to detect opens and shorts

TRI’s ToggleScan Test

BSCAN

Chip

DUT

- Connector/Socket

- BScan Chip

- Non-BScan Chip

- Capacitor Array

- Resistor Array

JTAG

Vectorless

Probe

DUT

BScan

Chip

BScan

Chip

BScan

Chip

BScan

Chip

Non-

BScan

Device

DUT

BScan

Chip

BScan

Chip

BScan

Chip

BScan

Chip

Non-

BScan

Device

Standard Chain Routing Virtual Chain Test

Board A Board A

Board A Board B

Board C Board D

Flow Based Debugging Parallel Test Program Debugging

DUT 1

TAP 1

SOFTWARE TAP ROUTING

TAP 2 TAP 3

DUT 2 DUT 3 DUT 1 DUT 2 DUT 3

TDO/TDI

TDI

TDO

TDO TDI TDO TDI TDO

TDO/TDI

Path/File Setting

Circuit Analysis

Device Generation

Program Configuration

Test Strategy

Wire Analyisis