3MAINTENANCE__O.pdf - 第106页
3.4 Device Test ④ TIME ( Unit : 1 / 1000 seconds ) This shows processing time of component recognition . “ 0 ” ( zero ) is displayed when the processing time is fast enough to keep up with the highest placement speed . U…
3.4
Device
Test
■
Result
of
Component
Recognition
•
After
recognition
is
completed
normally
for
component
recognition
test
,
the
following
(
example
)
appears
on
the
recognition
monitor
.
:
oooooooooooooooo
=
0000
Y
^
OOOO
THETA
-
OO
.
O
TIME
=
QOOO
Fig
.
3.10
①
p
=
0000000000000000
This
shows
a
component
ID
name
for
component
recognition
test
.
②
X
=
OOOO
and
Y
=
OOOO
(
Unit
:
/
/
m
)
These
show
positional
deviation
(
X
and
Y
)
of
the
component
to
be
picked
up
from
the
nozzle
center
.
The
point
of
intersection
of
the
crosslines
shows
the
center
of
positioned
component
.
Coordinate
System
Nozzle
Center
Note
:
The
point
of
intersection
of
the
crosslines
is
the
center
of
positioned
component
.
③
THETA
=
00.0
(
Unit
:
Degree
)
This
shows
angular
deviation
(
inclination
of
crosslines
)
of
picked
component
.
Coordinate
System
X
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3.4
Device
Test
④
TIME
(
Unit
:
1
/
1000
seconds
)
This
shows
processing
time
of
component
recognition
.
“
0
”
(
zero
)
is
displayed
when
the
processing
time
is
fast
enough
to
keep
up
with
the
highest
placement
speed
.
Use
the
value
as
reference
to
be
set
in
the
text
box
of
the
label
“
RECOG
.
TIME
”
at
the
“
COMPONENT
LIBRARY
”
display
.
•
When
an
error
in
recognition
occurs
during
component
recognition
test
,
nothing
appears
on
the
recognition
monitor
and
an
error
message
(
recognition
error
)
is
issued
on
the
touch
screen
.
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3.4
Device
Test
■
Setting
of
Test
ID
•
When
the
[
TEST
ID
SET
]
key
is
pressed
at
the
“
COMPONENT
RECOG
.
TEST
”
display
,
the
following
display
appears
on
the
screen
.
<
SET
TEST
!
0
>
(
9
/
1 0 0
)
DELETE
TEST
ID
TEST
ID
LIST
EFTIATA
)
5
!
!
5
*
i
；
FFFI
llilil
T
COMPONENT
^
>
7
MT
2135
B
7
S
3
inT
tQ
|
COMP
.
LIBRARY
(
12345678901
^
4587890123456789012
M
COMPONENT
I
.
LIBRARY
S
：
LIBRARY
TEST
ID
ENTRY
Fig
.
3
,
11
•
When
the
[
TEST
ID
ENTRY
]
key
is
pressed
,
the
component
ID
(
component
library
data
)
displayed
in
the
©
-
marked
text
box
is
registered
as
one
of
test
ID
data
listed
.
Note
:
Up
to
100
component
IDs
(
component
library
data
)
can
be
stored
in
memory
as
one
of
test
ID
data
listed
.
•
When
the
[
RTN
]
key
is
pressed
,
the
component
ID
at
the
line
cursor
position
in
the
list
box
of
the
label
“
TEST
ID
LIST
”
is
set
in
the
text
box
of
the
label
“
TEST
ID
”
at
the
“
COMPONENT
RECOG
.
TEST
”
display
.
•
When
the
[
DELETE
TEST
ID
]
key
is
pressed
,
the
test
ID
at
the
line
cursor
position
in
the
list
box
is
deleted
.
•
When
the
[
EDIT
DATA
]
key
is
pressed
，
a
display
appears
，
enabling
editing
of
data
corresponding
to
the
test
component
ID
(
component
library
data
)
at
the
line
cursor
position
in
the
list
box
.
Refer
to
“
3.7
Editing
of
Component
Library
Data
”
in
“
SECTION
PROGRAMMING
MANUAL
”
for
data
editing
.
n
•
When
the
[
COMPONENT
ID
ENTRY
]
key
is
pressed
,
the
test
ID
at
the
line
cursor
position
in
the
list
box
is
registered
component
ID
.
When
a
component
having
the
same
ID
is
already
registered
,
the
“
DATA
SAVE
MODE
”
display
appears
，
enabling
you
to
select
one
of
the
option
keys
(
[
SAVE
]
or
[
DON
’
T
SAVE
]
key
)
.
as
a
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