3MAINTENANCE__O.pdf - 第108页

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3.4
Device
Test
■
Setting
of
Test
ID
•
When
the
[
TEST
ID
SET
]
key
is
pressed
at
the
“
COMPONENT
RECOG
.
TEST
”
display
,
the
following
display
appears
on
the
screen
.
<
SET
TEST
!
0
>
(
9
/
1 0 0
)
DELETE
TEST
ID
TEST
ID
LIST
EFTIATA
)
5
!
!
5
*
i
；
FFFI
llilil
T
COMPONENT
^
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COMP
.
LIBRARY
(
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^
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M
COMPONENT
I
.
LIBRARY
S
：
LIBRARY
TEST
ID
ENTRY
Fig
.
3
,
11
•
When
the
[
TEST
ID
ENTRY
]
key
is
pressed
,
the
component
ID
(
component
library
data
)
displayed
in
the
©
-
marked
text
box
is
registered
as
one
of
test
ID
data
listed
.
Note
:
Up
to
100
component
IDs
(
component
library
data
)
can
be
stored
in
memory
as
one
of
test
ID
data
listed
.
•
When
the
[
RTN
]
key
is
pressed
,
the
component
ID
at
the
line
cursor
position
in
the
list
box
of
the
label
“
TEST
ID
LIST
”
is
set
in
the
text
box
of
the
label
“
TEST
ID
”
at
the
“
COMPONENT
RECOG
.
TEST
”
display
.
•
When
the
[
DELETE
TEST
ID
]
key
is
pressed
,
the
test
ID
at
the
line
cursor
position
in
the
list
box
is
deleted
.
•
When
the
[
EDIT
DATA
]
key
is
pressed
，
a
display
appears
，
enabling
editing
of
data
corresponding
to
the
test
component
ID
(
component
library
data
)
at
the
line
cursor
position
in
the
list
box
.
Refer
to
“
3.7
Editing
of
Component
Library
Data
”
in
“
SECTION
PROGRAMMING
MANUAL
”
for
data
editing
.
n
•
When
the
[
COMPONENT
ID
ENTRY
]
key
is
pressed
,
the
test
ID
at
the
line
cursor
position
in
the
list
box
is
registered
component
ID
.
When
a
component
having
the
same
ID
is
already
registered
,
the
“
DATA
SAVE
MODE
”
display
appears
，
enabling
you
to
select
one
of
the
option
keys
(
[
SAVE
]
or
[
DON
’
T
SAVE
]
key
)
.
as
a
3
一
18
ACP
01
EIN
3
-
18
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2
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M
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_
M
酬
MM
腳丽
_
醒酬
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COMPONENT
11
12
13
14
15
llli
5555555555555555
▲
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3.4
Device
Test
•
When
the
[
NEXT
COMP
.
LIBRARY
]
LIBRARY
]
key
is
pressed
,
the
next
or
previous
library
data
appears
in
the
“
COMP
.
LIBRARY
”
text
box
.
Note
:
When
the
[
COMPONENT
ID
LIST
]
key
is
pressed
,
the
“
COMPONENT
LIBRARY
(
COMPONENT
ID
LIST
(
XXX
/
800
)
)
”
display
(
Fig
.
3.12
)
appears
on
the
screen
.
At
this
display
,
the
[
SEARCH
COMPONENT
]
key
is
provided
to
easily
locate
component
ID
to
be
set
as
test
ID
.
The
searched
component
ID
is
displayed
in
the
@
-
marked
text
box
.
The
[
DATA
DISPLAY
]
key
is
also
provided
to
display
the
contents
of
component
library
data
.
the
[
PREY
.
COMP
.
or
〈
COMPONENT
LIBRARY
)
COMPONENT
10
LIST
(
XXX
/
800
)
臨
E
PP
^
E
N
RTN
3206
Fig
.
3.12
■
Setting
of
Feeder
No
.
When
the
[
FEEDER
NO
.
SET
]
key
is
pressed
at
the
“
COMPONENT
RECOG
.
TEST
”
display
，
the
following
display
appears
on
the
screen
.
〈
SET
FEEDER
N
0
.
>
F
B
101
FEEDER
NO
.
8
9
C
7
F
:
101
FEEDER
NO
.
4
5
6
關喘
EmkT
?
yp
2
3
1
KEY
.
rrfN
SET
0
4833
±
Fig
.
3
,
13
•
Press
the
data
key
beside
the
label
“
FEEDER
NO
.
SET
F
”
and
enter
a
parameter
using
the
ten
-
key
pad
.
After
that
，
press
the
[
SET
]
key
.
The
entered
parameter
is
set
in
the
text
box
of
the
label
“
FEEDER
NO
”
at
the
“
COMPONENT
RECOG
.
TEST
”
display
.
3
-
19
ACP
01
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3
-
19
DATA
DISPLAY
AAB
8
CCDDEEFFRR
II
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-
c
ABCDEFnn
ABCDCLFPn
ABn
-
r
-
rrpn
ABC
nucLFnh
»
HnDnlunuF
-
rrrth
ADUCnwpuF
ABCDEF
AOCDEFnh
ABC
nwsLLFAh
1
i
2
T
04
PD
67
^
3.4
Device
Test
■
Setting
of
Hysteresis
Test
•
When
the
[
HYSTERESIS
TEST
]
key
is
pressed
at
the
“
COMPONENT
RECOG
.
TEST
”
display
，
the
following
display
appears
on
the
screen
.
《
HYSTERESIS
TEST
)
RESULT
OF
HYSTERESIS
TEST
MODE
ffit
ENABU
HE
Y
Z
(
THETA
)
X
ON
TACT
-
TIME
0.14
S
fO
.
md
iO
.
lBO
*
FIRST
十
0.010
HEAD
ROTATE
THETA
3
?
0
.
令
0.200
*
f
0.020
疏
020
LAST
U
OF
HYSTERESIS
TEST
99
fO
.
010
f
0.010
OIFF
.
PLACEMENT
MODE
ENABLE
Mm
ENABLE
life
MODE
：
lOiSABlE
AKO
^
yflHE
^
ETfiEY
.
SET
Fig
.
3.13
-
1
①
OVERALL
TACT
-
TIME
REDUCTION
,
MODE
and
TACT
-
TIME
Set
“
ENABLE
1
“
MODE
”
.
Set
tact
time
in
the
text
box
of
the
label
“
TACT
-
TIME
”
.
The
tact
time
can
be
set
in
the
increments
of
O
.
Ol
second
.
'
DISABLE
^
in
the
text
box
of
the
label
or
②
HEAD
ROTATE
THETA
Set
head
rotation
angle
(
0
370
)
in
this
text
box
.
③
#
OF
HYSTERESIS
TEST
Set
number
of
hysteresis
times
in
this
text
box
.
(
Max
.
99
)
Number
of
hysteresis
times
is
the
number
of
reciprocating
times
of
actions
taken
between
station
#
4
and
stations
#
10
&
11
.
④
PLACEMENT
MODE
Set
“
ENABLE
”
or
“
DISABLE
”
in
this
text
box
.
When
“
ENABLE
5
is
set
,
component
placement
action
takes
place
at
station
#
9
.
•
Select
the
data
boxes
(
text
boxes
)
of
the
above
labels
①
to
④
and
enter
parameters
by
pressing
the
option
keys
or
using
the
ten
-
key
pad
.
.
•
When
the
[
EXECUTE
TEST
]
key
is
selected
and
the
[
MOVE
]
button
is
pressed
,
the
hysteresis
test
starts
.
After
the
test
is
over
,
the
test
result
appears
in
section
@
.
3
-
20
糊
3
-
001
ACP
01
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3
-
20