k-series-brochure - 第4页
6 7 E n s u re c o m p re h e n s ive de fe ct c o v er age T o e nable reliabl e data captu re and high -resolu tion 3D visualizat ion, the K series e xpand s defect co verage using a combinat ion of 2D te xt ure and s …
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K series 3D AOI
Take inspection to
another dimension
Powerful 3D AOI
Drill down into powerful image
library tools with advanced
algorithmic assistance.
Precise optical metrology
High-precision metrology
combining high-defi nition 2D
texture with shadow-free 3D
inspection that eliminates image
cropping and warpage e ects.
Complete test coverage
Comprehensive defect coverage
accurately measures component
body and solder joints to identify
misplaced components, tomb-
stones, lifted leads and more.
High resolution
camera
Telecentric optics
Laser
High
resolution
angular
cameras
LED
l i g h t i n g
Pin height
measurement
Coplanarity
Lifted lead Bridge
Tombstone
Actual images from K series
LEDs specifi c
measurements
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Ensure comprehensive
defect coverage
To enable reliable data capture and high-resolution 3D visualization,
the K series expands defect coverage using a combination of 2D texture
and shadow-free 3D inspection. This is made possible by a range of
state-of-the-art camera, 3D sensor and motion system technologies.
• High-resolution camera with fully telecentric
lens captures high-quality RGB images for
inspection and review.
• High-performance 3D sensor combines vertical
lasers to avoid projection shadows, optimized
angles to minimize intrinsic shadow e ects and
adaptive height fi ltering that adapts the sensor’s
sensitivity to component geometry.
Industry-leading performance
and production stability
Today’s lean and agile manufacturing calls for superior fi rst pass yield
e ciency and 100% performance portability from one line to another.
K series satisfi es the most demanding customers in the electronics assembly
industry where quality and productivity are both mission - and business -
critical. The system has been designed to optimize test coverage at line
speed for the smart factory while o ering 100% o ine capabilit ies.
• Superior uptime above 99.5%.
• Unifi ed software suite for pre-refl ow, post-refl ow and post-wave AOI applications.
• 100% o ine programming and tuning capabilities.
• Rapid inspection time up to 100 cm
2
/s.
• High-precision motion system utilizing three
linear motors for accurate high-speed motion
and 0.5 µm resolution optical encoders for
accurate positioning.
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Superior accuracy
for any product geometry
Fully integrated
process control
The K series paves the way to Automatic Optical Metrology (AOM) . It o ers
best-in-class accuracy and repeatability in X, Y, Z and Theta for e cient
process control. The unique combination of sub-pixel geometric pattern
matching technology, proprietary 3D algorithms and unique warpage and
distortion compensation leads to superior critical measurement capabilit ies.
With the Library Pro defect image bank, the K series ensures easy
pro gramming and requires minimal fi ne-tuning to reach top performance
levels. Add SIGMA Link, the industry’s most advanced web-based process
control software suite, and you’ll spend even less time correlating
databases , so you can focus on getting to the root cause of every defect.
• Vectoral Imaging pattern matching.
• +/- 5mm warpage compensation with full Z accuracy.
• Sub-pixel technology with 4.75µm X,Y resolution.
• Unifi ed source of SPI and AOI data with SIGMA Link, allowing you to view your process
in real time, quickly drill down to the defect image and take immediate corrective action.
• Library Pro improves test coverage and fi rst-pass yield over time to guarantee
unmatched levels of performance.
• Full machine-to-machine portability for all programs.