IPC-CM-770D-1996 - 第119页

January 1996 IPC-CM-770 Table 23-3 Minimum Bond Strength Wire Composition rocessing and screening when AU 0.0007 in AU 0.0013 in F 5 grams-force x number of bonds (bumps) Flip-clip Any G or H 30 grams force in accordance…

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IPC-CM-770 Januaty 1996
1
O0
70
30
20
::
10
I
O
J
v:
I
1980
1985
19
'NON-IBM YEAR
OTHER
GOLD
BALL
BONDING
73%
AI
BAL
L
3'1"
ALUMINUM
WEbGE
BONDING
22%
i%
t
2
2%
I
IPC-1-00338
Figure 23-1 Chip Termination Techniques
Table 23-1 Bonding Wire for COB Applications
Wire Diameter Substrate
(inch)
Comments
Temperature("C)
Attachment Method
Thermocompression (hot substrate)
I
>300
I
Limited repair ability
0.0007-0.001
(Gold)
0.0007-0.002
Thermosonic ball or wedge 125°C Quality of bonds improved if the
substrate is raised to 125°C. Can bond
chips without raising substrate
temperature.
(Aluminum)
I
Ultrasonic Wedge
0.0007-0.010
I
25 Low-temperature process, restricted due
to tool size
Table 23-2 Aluminum and Gold Wire Sizes and Ratings
Wire
Minimum
Standard Wires
Aluminum
1%
Si Aluminum
1%
Si Diameter
Resistance(Rm.)
(inch)
Gold
(Annealed) (Hard)
Gold Aluminum
I
0.0007
I I
X
I
36.06-39.86
I
34.62-38.273
I
27.71-29.43
I
I
0.001
I
X
I
X
I
17.67-19.53
I
16.0-18.75
I
13.58-14.42
I
I
0.002
I I
X
I
4.41-4.88
I
4.23-4.68
I
3.40-3.61
I
23.3.4 Wire Bonding Techniques
300"
to
400"
C. The majority of T/C bonding uses a ball
bond on the first bond site and a wedge bond on the sec-
23.3.4.1 Thermocompression (T/C) Bonding (Ball Bond-
ond bond site.
ing)
Thermocompression bonding utilizes heat and pres- When bonding an open flame (or spark discharge) melts
sure to bond wire to a metallized pad site.
A
typical system the end of the wire, molten metal wicks up the end of the
uses a capillary tool of refractory material, such as alumina wire forming the ball. Wire termination after the second
or tungsten carbide, gold wire, and a surface temperature of bond is achieved by flame
off
or as in wedge bonding cut
5-16
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January 1996 IPC-CM-770
Table 23-3 Minimum Bond Strength
Wire Composition rocessing and screening when
AU 0.0007 in
AU 0.0013 in
F
5
grams-force
x
number of bonds (bumps)
Flip-clip
Any
G
or
H
30 grams force in accordance with linear millimeter of Beam Lead
Any
nominal undeformed (before bonding) beam width.3
'For wire diameters not specified, use the curve of figure 2011-1 to determine the bond pull limit.
2For ribbon wire, use the equivalent round wire diameter which gives the same cross-sectional area as the ribbon wire
3For condition
G
or H, the bond strength shall be determined by dividing the breaking force by the total of the nominal
being tested.
beam widths before bonding.
or tear off. Flame off produces another ball for the next
bond, cut off used cutters, and tear off pulls the wire until
it breaks. See Figure 23-2 for T/C ball bonding and Figure
23-5 for wedge bonding.
23.3.4.2 Ultrasonic
(UIS)
Bonding (Wedge Bonding)
An
ultrasonic bond is accomplished by pressing and holding
the wire firmly to the metallized pad site. Ultrasonics are
transferred through a wedge tool, creating a scrubbing
action, producing a metallurgical cold weld. The scrubbing
action may remove thin oxide films which form in standard
atmosphere. Use caution with the amount of power sup-
plied to produce the ultrasonics. Using too much power
may damage the chip during bonding. The most common
failure associated with excessive power is cratering. The
majority of U/S bonding applications use aluminum-alloy
wire, although gold, copper, and other metals have been
used. See Figure 23-4. Bonding dissimilar metals at low
temperatures eliminates, or significantly decreases, the for-
mation of intermetallic compounds and allows bonds to be
made in the immediate vicinity of temperature-sensitive
components without adverse effects.
23.3.4.3 Thermosonic (TIS) Bonding (Ball or Wedge
Bonding)
Thermosonic bonding incorporates T/C and U/S
bonding. Using thermal compression in unison with ultra-
sonic to produce a bond, the amount of force, heat, and
ultrasonics are less than for T/C and U/S. The substrate
temperature for T/S is lower than T/C, around 120" to
150°C. Thermosonic bonding can use either ball or wedge
bonding methods with gold wire. See Figure 23-5.
23.4 Assembly
23.4.1 Equipment Assisted Hand Assembly
Systems
are available for limited hands off use. Stations for place-
ment of die on boards under a microscope include a
vacuum tip and a motion reduction system. The system
allows increased precision placement of one of a kind part.
Some systems also integrate adhesive dispensing options
which can easily toggle between dispensing adhesive and
die placement.
23.4.2 Low-Volume Equipment
The low-volume surface
mount assembly equipment shown in Figure 23-6 is a com-
puter controlled pick-and-place machine. The machine can
select surface mount devices from tray carriers, vibratory
feeders and tape input. The system orients and aligns sur-
face mount devices on an automatic centering nest, then
accurately assembles them on the boards at preprogrammed
locations. Such a system can be equipped with provisions
for chip on board (COB). The additional equipment may
include a die attachment epoxy dispensing system, wafer
frame or die tray loader elevators, and pattern recognition
for orienting the die.
The basic system, Figure 23-7, consists of a transfer mod-
ule and a controller. The system controller provides the
interface and control electronics; the transfer module is
5-17
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IPC-CM-770
Januaty
1996
3.
Bond
Force
R
I
6.
Second Search
9.
Ball is
Reformed
Torch
1.
Home
Wire
of
Wire
Ball on End
n
4.
Tip Withdrawn
7.
Wedge Bonding
Operation
o1
,ce
8.
Alt. Tail
Pulling
!.
Search
i.
Work Moved Toward
Next
Position
B.
Tip
Withdrawn
m
Wedge
Diffusion
Bond
9.
Alt. Tail
Pulling
Ball
is
Retracted
d
IPC-1-00341
Figure
23-2
Mechanics
of
Thermocompression
Ball
Wire
Bonding
5-18
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Licensed by Information Handling Services