IPC CH-65B CHINESE.pdf - 第75页

29. V uono, B., Bixenman, M., Russeau, J., & Zohni, . ( 2010 ) . Cleaning Fluid Entrapments under V ented Flip Chip Packages. IPC / SMT A Cleaning and Coating Conference, Renaissance, Schaumberg, IL. 7 印制线路板( PWB )上…

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11. Camden, E. (2010). Effective Spot Cleaning Regardless of Material Selection. IPC/SMTA Cleaning and
Coating Conference, Renaissance, Schaumberg, IL.
12. Flaherty, L., Knar, R., & Austin, J. (2010). Building High Reliability Electronic Hardware within the
California Air Regulatory Environment. IPC/SMTA Cleaning and Coating Conference, Renaissance,
Schaumberg, IL.
13. Hafstad, G. (2010). Assembly Configurations and Process Design Considerations for Solvent Centrifugal
Cleaning. IPC/SMTA Cleaning and Coating Conference, Renaissance, Schaumberg, IL.
14. Hillman, D. (2010). The Role of Ionic Contamination as a Tin Whisker Initiator. IPC/SMTA Cleaning and
Coating Conference, Renaissance, Schaumberg, IL.
15. Pauls, D. & Hillman, D. (2010). Cleaning and Cleanliness in IPC Specifications. IPC/SMTA Cleaning and
Coating Conference, Renaissance, Schaumberg, IL.
16. Kanegsberg, B. (2010). Doing it all with Less - Sustainable, Eco-Centric, Reliable, Economically Supe-
rior Defluxing Processes. IPC/SMTA Cleaning and Coating Conference, Renaissance, Schaumberg, IL.
17. Keeping, J. (2010). Critical Considerations for Conformal Coating Reliability. IPC/SMTA Cleaning and
Coating Conference, Renaissance, Schaumberg, IL.
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Coating Conference, Renaissance, Schaumberg, IL.
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or Printed Circuit Assemblies. IPC/SMTA Cleaning and Coating Conference, Renaissance, Schaumberg,
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2010). Advances in Adhesion Solutions for Electronic Assemblies. IPC/SMTA Cleaning and
Coating Conference, Renaissance, Schaumberg, IL.
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ence, Renaissance, Schaumberg, IL.
24. Russo, J. (2010). Encouraging Water and Energy Conservation: Driving Forces. IPC/SMTA Cleaning
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Board and Component Cleanliness on Whisker Formation. IPC/SMTA Cleaning and Coating Conference,
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IPC-CH-65B-C 20117
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Copyright Association Connecting Electronics Industries
Provided by IHS under license with IPC
Not for Resale, 11/27/2015 19:13:55 MST
No reproduction or networking permitted without license from IHS
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29. Vuono, B., Bixenman, M., Russeau, J., & Zohni, . (2010). Cleaning Fluid Entrapments under Vented Flip
Chip Packages. IPC/SMTA Cleaning and Coating Conference, Renaissance, Schaumberg, IL.
7 印制线路板(PWB)上的污染及其影响
7.1 范围 电子设性能要求的要设计小的线间距及小化、性能设备需
更加的电路。导体间间距小,使得污染及其影响变更加问题化。
7.1.1 ⽬的 本章节的目的讨论印制线路组件上污染的风险及其影
7.1.2 背景 着元器件的微型化、细间距线的电力,电子组装的可
1
和污染有关的工艺过程和务增大了元器在可能。腐蚀问题缩产品寿命
于造线间离迁移元器、电合和/或者电化学电因素
导致产品功能性降低
1
生产成本力的动下考虑带细间距密度组装清洗许多电子
使用了残留清洗)助焊剂技术。
2
据应用的不流后助焊剂残留是变化的:
标准残留>40%
•低残留10%<残留40%
•超残留2%<残留10%
残留 0残留2%
其在小的线间距时,清洗工PCB性的长响是一个持
的目标。着无铅化技术的步引了可风险
这些金比
铅共更高熔融
2
组件装和密度化、组件下面会助焊剂残留)及元器件的微型化组装使
达到适的清洁等级越难。组装必须更好地组装残留的长
9
的清洗,线间距产生大的电导致器业对清洁技术范对下
一代电子组装的。
9
7.2 术语和定义(带*IPC-T-50
7.2.1 *阳极 件中的流流出的电
7.2.2 离⼦: 子。
7.2.3 *接: 导体间形成的不有的电通路。
7.2.4 得到电子的电
7.2.5 离⼦: 带正子。
7.2.6 * 物质或者材料通电的能力。
7.2.7 *间距 在一个上,的相的可距离
7.2.8 腐蚀 化学助焊剂或者助焊剂残留金属材的化。
20117 IPC-CH-65B-C
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Copyright Association Connecting Electronics Industries
Provided by IHS under license with IPC
Not for Resale, 11/27/2015 19:13:55 MST
No reproduction or networking permitted without license from IHS
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7.2.9 *腐蚀性焊剂: 含有一、有或者腐蚀助焊剂
7.2.10 腐蚀 PCB表面长出
7.2.11 *树枝 凝潮湿气及在电时,导体间生长的金属
7.2.12 树枝状迁移 “树枝状结晶”形穿绝缘迁移
7.2.13 的一对电
正极/
7.2.14 子、电子及们的子核一部分带正电,一部分带电的式排列。
7.2.15 ⾦属 金属程,通化学物质、合或者污染产生
7.2.16 电化学迁移 7.2.16电化学迁移ECM
[不要和电迁移EM下面]电化学迁移
是离子在电下通合适的
助焊剂残留桥接导体迁移的现
。电化学
效机理三个要组成:(1残留;2)电
或者3或者湿7-1
7.2.17 迁移EM [不要和电化学迁移
ECM 上面]迁移在电的影下,
电子迁移造金属子在金属导体动的
。电迁移的三个关1
2动的金属
3高温7-2
7.2.18 助焊剂: 化学和物理活性的
时能去焊料和可表面金属
料对金属材的润湿
7.2.19 *助焊剂活性: 助焊剂熔融润湿
金属表面的程度或者效率
7.2.20 助焊剂残留物: 焊接残留
围的助焊剂
7.2.21 腐蚀 内两种导体
或者内两种导体组成的
腐蚀
7.2.22 化物量: 物质量与助焊剂质之比子(F-)子(Cl-)或者
子(Br-),表示为子的许远低含量。
7.2.23 机助焊剂: 含有无机水基助焊剂溶液
7.2.24 离⼦清洁度 用单位表面积所含有的 或者离物质量来表示表面清洁的程
。表面清洁定于使用何方法测试
以等表示。
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IPC-CH-65B-C 20117
62
Copyright Association Connecting Electronics Industries
Provided by IHS under license with IPC
Not for Resale, 11/27/2015 19:13:55 MST
No reproduction or networking permitted without license from IHS
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