2500_Users_Manual - 第373页

Trans lation Fo rmats ProM aster 25 00 User Manua l D-4 3 • The U-field cells ar e not included in the C (fuse checksum) field. • The U field reads left to right to be consis tent with the L (fuse list) and E fields. The…

Translation Formats

D-42 ProMaster 2500 User Manual

The P Field

The P field remaps the device pinout and is used with the V (test vector)

field. An asterisk terminates the field. The syntax of the field is as

follows:

<pin list>::=’P’<pin number>:N’*’

The following example shows a P field, V field, and the resulting

application:

P 1 2 3 4 5 6 14 15 16 17 7 8 9 10 11 12 13 18 19 20 *

V0001 111000HLHHNNNNNNNNNN*

V0002 100000HHHLNNNNNNNNNN*

The result of applying the above P and V fields is that vector 1 will apply

111000 to pins 1 through 6, and HLHH to pins 14 through 17. Pins 7

through 13 and 18 through 20 will not be tested.

JEDEC U and E

Fields

As of Version 2.5, the programmer supports the optional JEDEC U (user

data) and E (electrical data) fields. The U and E fields are described

below.

Note: Implementation of the JEDEC U and E fields is not part of the JEDEC-3C

(JESD3-C) standard.

User Data (U Field)

The

field allows user data fuses that do not affect the logical or

electrical functionality of the device to be specified in JEDEC files. For

instance, the U field can be used to specify the User Data Signature fuse

available in some types of PLD devices because this fuse contains

information only (it has no logical or electrical functionality).

Note: To have the JEDEC U field processed correctly, you must select the device

before downloading the JEDEC file.

The following guidelines apply to the U field:

• The U field must be included for devices with U fuses.

• Each U-field cell must be explicitly provided if the U field is present.

• The F (default fuse state) field does not affect U fuses.

• There can only be one U field in a JEDEC file.

• The U field fuses must be listed in the order they appear in the

device.

• The U field must be listed after the L field and E field (if used), and

before the V (test vector) field (if used).

• The U field is specified using binary numbers, since the full number

of U-field cells is otherwise unknown.

• The number of cells specified in the U field is not included in the QF

(number of fuses) field.

Translation Formats

ProMaster 2500 User Manual D-43

• The U-field cells are not included in the C (fuse checksum) field.

• The U field reads left to right to be consistent with the L (fuse list) and

E fields.

The syntax for the U field is as follows:

<User Data Fuse List>::’U’<binary-digit(s)>’*’

The character U begins the U field and is followed by one binary digit for

each U fuse. Each binary digit indicates one of two possible states (zero,

specifying a low-resistance link, or one, specifying a high-resistance link)

for each fuse.

For example,

QF24*

L0000

101011000000000000000000*

E10100111*

C011A*

U10110110*

Electrical Data (E field)

The

field allows special feature fuses that do not affect the logic

function of the device to be specified in JEDEC files.

The following guidelines apply to the E field:

• The E-field cell must be explicitly provided if the E field is present.

• The F (default fuse state) field does not affect E fuses.

• There can only be one E field in a JEDEC file.

• The E field fuses must be listed in the order they appear in the device.

• The E field must be listed before the C (checksum) field. If the U field

is used, the E field must come before the U (user data) field.

• The E field is specified using binary numbers, since the full number

of E-field cells is otherwise unknown.

• The number of cells specified in the E field is not included in the QF

(number of fuses) field.

• The E-field cells are included in the C (fuse checksum) field.

• The E field reads left to right for the purpose of checksum calculation.

The syntax for the E field is as follows:

<Electrical Data Fuse List>::’E’<binary digit(s)>’*’

The character E begins the E field and is followed by one binary digit for

each E fuse. Each binary digit indicates one of two possible states (zero,

specifying a low-resistance link, or one, specifying a high-resistance link)

for each fuse. For example,

QF24*

L0000

101011000000000000000000*

E10100111*

C011A*

U10110110*

Translation Formats

D-44 ProMaster 2500 User Manual

Test Field (V field)

<function test> :: = [<pin list>] <test vector> {<test vector>}

N :: = number of pins on device

<test vector> :: = ‘V’ <number> <delimiter> < test condition> :N ‘* ‘

<test condition> :: = <digit> ‘B’ | ‘C’ | ‘D’ | ‘F’ | ‘H’ | ‘K’ | ‘L’ | ‘N’ | ‘P’

| ‘U’ | ‘X’ | ‘Z’

<reserved condition> :: = ‘A’ | ‘E’ | ‘G’ | ‘I’ | ‘J’ | ‘M’ | ‘O’ | ‘Q’ | ‘R’ |

‘S’ | ‘T’ | ‘V’ | ‘W’ | ‘Y’ | ‘Z’

Functional test information is specified by test vectors containing test

conditions for each device pin. Each test vector contains

test conditions,

where n is the number of pins on the device. The following table lists the

conditions that can be specified for device pins.

When using structured test vectors to check your logic design, do NOT

use 101 or 010 transitions as tests for clock pins: use C, K, U, or D instead.

Test Conditions

Note: C, K, U, and D are clocking functions that allow for setup time.

The C, K, U, and D driving signals are presented after the other inputs are

stable. The L, H, and Z tests are performed after all inputs have

stabilized, including C, K, U, and D.

Test vectors are numbered by following the V character with a number.

The vectors are applied in numerical order. If the same numbered vector

is specified more than one time, the data in the last vector replace any

data contained in previous vectors with that number.

0 Drive input low

1 Drive input high

2-9 Drive input to supervoltage #2-9

B Buried register preload (not supported)

C Drive input low, high, low

D Drive input low, fast slew

F Float input or output

H Test output high

K Drive input high, low, high

L Verifies that the specified output pin is low

N Power pins and outputs not tested

P Preload registers

U Drive input high, fast slew

X Output not tested, input default level

Z Test input or output for high impedance