2500_Users_Manual- - 第374页

Translation Formats Test Field (V field) < function test> :: = [<pin list〉] <test vector> {<test vector>} <pin number> :: = < delimiter > <number> N :: = number of pins on device &l…

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<User Data Fuse List>::’U’<binary-digit(s)>’*’
QF24*
L0000
101011000000000000000000*
E10100111*
C011A*
U10110110*
<Electrical Data Fuse List>::’E’<binary digit(s)>’*’
QF24*
L0000
101011000000000000000000*
E10100111*
C011A*
U10110110*
Translation
Formats
Electrical
Data
(E
field)
•
The
U-field
cells
are
not
included
in
the
C
(fuse
checksum)
field.
•
The
U
field
reads
left
to
right
to
be
consistent
with
the
L
(fuse
list)
and
E
fields.
The
syntax
for
the
U
field
is
as
follows:
The
character
U
begins
the
U
field
and
is
followed
by
one
binary
digit
for
each
U
fuse.
Each
binary
digit
indicates
one
of
two
possible
states
(zero,
specifying
a
low-resistance
link,
or
one,
specifying
a
high-resistance
link)
for
each
fuse.
For
example,
The
E
field
allows
special
feature
fuses
that
do
not
affect
the
logic
function
of
the
device
to
be
specified
in
JEDEC
files.
The
following
guidelines
apply
to
the
E
field:
•
The
E-field
cell
must
be
explicitly
provided
if
the
E
field
is
present.
•
The
F
(default
fuse
state)
field
does
not
affect
E
fuses.
•
There
can
only
be
one
E
field
in
a
JEDEC
file.
•
The
E
field
fuses
must
be
listed
in
the
order
they
appear
in
the
device.
•
The
E
field
must
be
listed
before
the
C
(checksum)
field.
If
the
U
field
is
used,
the
E
field
must
come
before
the
U
(user
data)
field.
•
The
E
field
is
specified
using
binary
numbers,
since
the
full
number
of
E-field
cells
is
otherwise
unknown.
•
The
number
of
cells
specified
in
the
E
field
is
not
included
in
the
QF
(number
of
fuses)
field.
•
The
E-field
cells
are
included
in
the
C
(fuse
checksum)
field.
•
The
E
field
reads
left
to
right
for
the
purpose
of
checksum
calculation.
The
syntax
for
the
E
field
is
as
follows:
The
character
E
begins
the
E
field
and
is
followed
by
one
binary
digit
for
each
E
fuse.
Each
binary
digit
indicates
one
of
two
possible
states
(zero,
specifying
a
low-resistance
link,
or
one,
specifying
a
high-resistance
link)
for
each
fuse.
For
example,
ProMaster
2500
User
Manual
D-43
Translation
Formats
Test
Field
(V
field)
<
function
test>
::
=
[<pin
list〉]
<test
vector>
{<test
vector>}
<pin
number>
::
=
<
delimiter
>
<number>
N
::
=
number
of
pins
on
device
<test
vector>
::
=
'V'
<number>
<delimiter>
<
test
condition〉
：
N
vtest
condition〉
=
vdigit>
B
「CTDTFTHTKTLTN」P
|u「xtz，
〈
reserved
condition〉
：：
=
'A'
|
E
|
'G'
|
T
|
'J'
|
'M'
|
'0'
|
Q
|
'R'
|
Functional
test
information
is
specified
by
test
vectors
containing
test
conditions
for
each
device
pin.
Each
test
vector
contains
n
test
conditions,
where
n
is
the
number
of
pins
on
the
device.
The
following
table
lists
the
conditions
that
can
be
specified
for
device
pins.
When
using
structured
test
vectors
to
check
your
logic
design,
do
NOT
use
101
or
010
transitions
as
tests
for
clock
pins:
use
C,
K,
U,
or
D
instead.
Test
Conditions
Drive
input
low
Drive
input
high
Drive
input
to
supervoltage
#2-9
Buried
register
preload
(not
supported)
Drive
input
low,
high,
low
Drive
input
low,
fast
slew
Float
input
or
output
Test
output
high
Drive
input
high,
low,
high
Verifies
that
the
specified
output
pin
is
low
Power
pins
and
outputs
not
tested
Preload
registers
Drive
input
high,
fast
slew
Output
not
tested,
input
default
level
Test
input
or
output
for
high
impedance
0
1
2-9
B
C
D
F
H
L
N
P
U
X
z
Note:
C,
K,
U,
and
D
are
clocking
functions
that
allow
for
setup
time.
The
C,
K,
U,
and
D
driving
signals
are
presented
after
the
other
inputs
are
stable.
The
L,
H,
and
Z
tests
are
performed
after
all
inputs
have
stabilized,
including
C,
K,
U,
and
D.
Test
vectors
are
numbered
by
following
the
V
character
with
a
number.
The
vectors
are
applied
in
numerical
order.
If
the
same
numbered
vector
is
specified
more
than
one
time,
the
data
in
the
last
vector
replace
any
data
contained
in
previous
vectors
with
that
number.
D-44
ProMaster
2500
User
Manual
V0001C01010101NHLLLHHLHLN*
V0002C01011111NHLLHLLLHLN*
V0003C10010111NZZZZZZZZZN*
V0004C01010100NFLHHLFFLLN*
Translation
Formats
The
following
example
uses
the
V
field
to
specify
functional
test
information
for
a
device:
ProMaster
2500
User
Manual
D-45